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公开(公告)号:US20230328556A1
公开(公告)日:2023-10-12
申请号:US17658188
申请日:2022-04-06
Applicant: QUALCOMM Incorporated
Inventor: Kuo-Chun LEE , Arvind Vardarajan SANTHANAM , Brian Clarke BANISTER , Bhupesh Manoharlal UMATT , Xuepan GUAN , Jyotica YADAV , Ehren J D VAN MELLE , Gautham JAYARAM , Sumit Kumar SINGH , Touseef KHAN , Arjun SURI , Sushant VIKRAM , Longjun CHEN , Sasikanth Reddy ADAPALA
Abstract: This disclosure provides systems, methods and apparatuses for measurement of cells and determination of a non-standalone (NSA) coverage status using an NSA coverage database. The NSA coverage database may indicate candidate frequencies of New Radio (NR) cells that provide NSA coverage corresponding to a given Long Term Evolution (LTE) serving cell. The NSA coverage database may also indicate whether a system information block 1 (SIB1) has been previously received on a candidate frequency. The user equipment (UE) may perform measurement of candidate frequencies using the NSA coverage database, and may identify cases where a cell not providing NSA coverage has a same candidate frequency as a cell providing NSA coverage using the indication of whether SIB1 has been previously received on a candidate frequency.
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公开(公告)号:US20230171713A1
公开(公告)日:2023-06-01
申请号:US17456800
申请日:2021-11-29
Applicant: QUALCOMM Incorporated
Inventor: Sushant VIKRAM , Arvind Vardarajan SANTHANAM , Jyotica YADAV , Xiaoning LU , Kushang DESAI
CPC classification number: H04W56/001 , H04W24/10 , H04W24/02
Abstract: Apparatus, methods, and computer-readable media for enhanced inter-frequency detection between misaligned base stations are disclosed herein. A user equipment (UE) may determine that a neighbor cell associated with a first frequency is misaligned with a serving cell associated with a second frequency different than the first frequency based on first measurements of the neighbor cell within a first measurement gap window having a first length. The UE may detect a location of a synchronization signal block (SSB) associated with the neighbor cell within a second measurement gap window having a second length greater than the first length. The UE may determine an alignment offset between the location of the SSB and the first measurement gap window. The UE may obtain second measurements of the neighbor cell within a third measurement gap window that includes the location of the SSB based on the alignment offset and parameters of the SSB.
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