公开(公告)号：US20230171006A1

公开(公告)日：2023-06-01

申请号：US18162805

申请日：2023-02-01

Applicant: QUALCOMM Incorporated

Inventor： Gaurav VERMA ,  David COLLINS ,  Ryan Reddy WENDLANDT ,  Prachi DESHPANDE ,  Gaurav SINGHANIA ,  Karthik MONCOMBU RAMAKRISHNAN ,  Jeffrey CARR ,  Anushruti BHATTACHARYA ,  Dennis FEENAGHTY

IPC: H04B17/14 ,  H04B1/00 ,  H01Q3/26 ,  H04B17/19 ,  H04B1/50

CPC classification number: H04B17/14 ,  H04B1/0064 ,  H01Q3/267 ,  H04B17/19 ,  H04B1/50

Abstract: Methods and systems for automated testing of extremely-high frequency devices are disclosed. A device under test (DUT) is set in a simultaneous transmit and receive mode. The DUT receives a lower frequency radio frequency (RF) signal from a test unit and up-converts the lower frequency RF signal to a higher frequency RF signal. The DUT transmits the higher frequency RF signal using a first antenna, and receives the higher frequency RF signal using a second antenna. The DUT down-converts the received higher frequency RF signal to a received test RF signal and provides the received test RF signal to the test unit for comparing measurements derived from the received test signal to a design specification for the DUT.