公开(公告)号：US10481202B2

公开(公告)日：2019-11-19

申请号：US15835227

申请日：2017-12-07

Applicant: QUALCOMM Incorporated

Inventor： Arvind Jain ,  Nishi Bhushan Singh ,  Rahul Gulati ,  Pranjal Bhuyan ,  Rakesh Kumar Kinger ,  Roberto Averbuj

IPC: G01R31/317 ,  G01R31/3187 ,  G01R31/319 ,  G01R31/3183 ,  G01R31/3185 ,  G06F9/448

Abstract: A self-test controller includes a memory configured to store a test patterns, configuration registers, and a memory data component. The test patterns are encoded in the memory using various techniques in order to save storage space. By using the configuration parameters, the memory data component is configured to decode the test patterns and perform multiple built-in self-test on a multitude of test cores. The described techniques allow for built-in self-test to be performed dynamically while utilizing less space in the memory.