公开(公告)号：US20210096182A1

公开(公告)日：2021-04-01

申请号：US16589968

申请日：2019-10-01

Applicant: QUALCOMM Incorporated

Inventor： Tapan Jyoti CHAKRABORTY ,  Umesh SRIKANTIAH ,  Rachana ROUT

IPC: G01R31/317 ,  G01R31/3177

Abstract: In some aspects, the present disclosure provides a method for testing an integrated circuit (IC). In some configurations, the method includes determining, by a test controller embedded in the IC, a change in operation of the IC from a normal mode to a test mode. The method also includes communicating, by the test controller to a chain of data storage elements in the IC: a first test signal configured to change an input/output (I/O) function of a first IC pin, and a second test signal configured to apply one of a plurality of test functions to each data storage element in the chain of data storage elements. The method also includes, receiving, via a second IC pin, a test clock signal configured to control a latch function of each data storage element in the chain of data storage elements.