公开(公告)号：US20250130187A1

公开(公告)日：2025-04-24

申请号：US18921393

申请日：2024-10-21

Applicant: Purdue Research Foundation

Inventor： Aalok U. Gaitonde ,  Aaditya A. Candadai ,  Justin A. Weibel ,  Amy M. Marconnet

IPC: G01N25/18 ,  G01J5/00 ,  G01J5/0806

Abstract: An apparatus for measuring a property of a material sample includes a heatsink, a heat source, and a two-dimensional transient thermal imaging system. The heatsink is configured to support a material sample at a fixed position thereon and to maintain a preconfigured contact temperature with the material sample. The heat source is configured to direct an input heat signal at a fixed position toward an opening of the heatsink toward the material sample. The two-dimensional transient thermal imaging system is configured to generate a resultant two-dimensional transient temperature distribution dataset associated with the material sample upon the heat source directing the input heat signal toward the opening to heat the material sample.