Abstract:
Operator-controlled implementations of user preferences are provided when feasible. User preference data is obtained by the operator and compared to operational characteristics and parameters of a communication system, such as a DSL system, to determine whether one or more of the user preferences can be implemented in the communication system. When implementation of a user preference would violate operational rules of the system, or where implementation would adversely affect system operation, the preference need not be implemented. However, when a user preference can be implemented in the system without causing problems, the operator can implement (or permit another party to implement) the user preference to effect the user's desires. The user preference data can be obtained directly from users (for example, by surveys and other direct user feedback) or can be obtained indirectly (for example, by constructing a Hidden Markov Model that shows user preferences). The operator may collect the user preference data from a user set (for example, a single user or a plurality of users). The user preference data can be compared to 2 or more performance metrics that can be adjusted, to the extent feasible, to implement the user preference data.
Abstract:
An illumination system for an extreme ultraviolet (EUV) lithography system may include multiple sources of EUV light. The system may combine the light from the multiple sources when illuminating a mask.
Abstract:
Techniques, methods, and structures disclosed in relation to extreme ultraviolet (EUV) lithography in semiconductor processing. In one exemplary implementation, a method may comprise using ion beam deposition to deposit a first multilayer stack of thin films on a substrate to planarize and smooth surface defects on the substrate. The method includes using atomic layer deposition to deposit a second multilayer stack of thin films on the first multilayer stack of thin films. The second multilayer stack of thin films may comprise an extreme ultraviolet reflective multilayer stack. The second multilayer stack of thin films may comprise fewer surface defects than the first multilayer stack of thin films. The method may further comprise processing an extreme ultraviolet mask blank to form an extreme ultraviolet reflective mask.
Abstract:
A Digital Subscriber Line (DSL) Management Center (DMC) coupled to a DSL network includes a data collection module that receives information regarding the DSL network from a plurality of sources. An analysis module is coupled to the data collection module to analyze the received information and issue a command for one or more of a plurality of DSL performance enhancement devices to optimize their operation. A command signal generation module is coupled to the analysis module to receive the issued command from the analysis module and generate a corresponding command signal for transmission to one or more of the DSL performance enhancement devices.
Abstract:
An illumination system for an extreme ultraviolet (EUV) lithography system may include multiple sources of EUV light. The system may combine the light from the multiple sources when illuminating a mask.
Abstract:
Methods, techniques, computer program products, apparatus, devices, etc., used in connection with DSL Management Interfaces, significantly improve the management capabilities of a DSL network and/or improve testing relating to DSL equipment and services by permitting better control and operation of a DSL system, including implementation of timestamping for more accurate measurement, monitoring and control of a system. Timestamping further allows customized data collection techniques, where a DSL line can be measured or monitored at intervals whose frequency depends on the line's stability. Moreover, data parameter read and control parameter write operations are presented in conjunction with the use of timestamping. Also, control and operation of a DSL system is enhanced by implementing bit-loading that minimizes, eliminates or otherwise mitigates the amount by which the SNR margin per tone exceeds a maximum SNR margin quantity, where such bit-loading can be selected through an appropriate interface.
Abstract:
Techniques, methods, and structures disclosed in relation to extreme ultraviolet (EUV) lithography in semiconductor processing. In one exemplary implementation, a method may comprise using ion beam deposition to deposit a first multilayer stack of thin films on a substrate to planarize and smooth surface defects on the substrate. The method includes using atomic layer deposition to deposit a second multilayer stack of thin films on the first multilayer stack of thin films. The second multilayer stack of thin films may comprise an extreme ultraviolet reflective multilayer stack. The second multilayer stack of thin films may comprise fewer surface defects than the first multilayer stack of thin films. The method may further comprise processing an extreme ultraviolet mask blank to form an extreme ultraviolet reflective mask.
Abstract:
An illumination system for an extreme ultraviolet (EUV) lithography system may include multiple sources of EUV light. The system may combine the light from the multiple sources when illuminating a mask.
Abstract:
A Digital Subscriber Line (DSL) Management Center (DMC) coupled to a DSL network includes a data collection module that receives information regarding the DSL network from a plurality of sources. An analysis module is coupled to the data collection module to analyze the received information and issue a command for one or more of a plurality of DSL performance enhancement devices to optimize their operation. A command signal generation module is coupled to the analysis module to receive the issued command from the analysis module and generate a corresponding command signal for transmission to one or more of the DSL performance enhancement devices.
Abstract:
Methods, apparatus and computer program products allow a user of DSL or the like to implement user preferences to the extent feasible in light of operational limits and conditions. In some embodiments, an operational profile is imposed on the user. User preference data is evaluated to determine the extent to which one or more user preferences can be implemented in light of the operational profile. One or more controllers can assist in collecting user preference data, evaluating the user preference data, operational data and other data and information, and implementing user preferences as feasible. Evaluation of the user preference data and operational profile and/or data can include considering the compatibility of the user's preferences and the operational profile and/or data. Controllers assisting users can include a local controller at the user's location, one or more upstream-end local controllers, one or more remote location controllers, and/or one or more other downstream-end device controllers at locations other than the user's location. Data and information can be shared among the various controllers, either using the DSL system itself or using a proprietary or other alternative data system.