公开(公告)号：US09488568B2

公开(公告)日：2016-11-08

申请号：US14568122

申请日：2014-12-12

Applicant: Otsuka Electronics Co., Ltd.

Inventor： Kazuhiro Sugita ,  Yusuke Yamazaki ,  Haruka Otsuka

IPC: G01N21/21

CPC classification number: G01N21/211 ,  G01N2021/213 ,  G01N2201/0675

Abstract: Provided is a polarization analysis apparatus that can quickly measure the polarization properties of a sample. The polarization analysis apparatus includes a light source configured to emit light in a predetermined wavelength region, a polarizer configured to transmit the light emitted from the light source, a spatial phase modulator configured to transmit the light from the sample, an analyzer configured to transmit the light that has passed through the spatial phase modulator, and an imaging spectrometer configured to receive the light that has passed through the analyzer. The spatial phase modulator is formed of a birefringent material, and is configured to have different phase differences at respective positions in a first direction in a plane orthogonal to an optical axis. The imaging spectrometer disperses the received light in a second direction that is different from the first direction in the plane orthogonal to the optical axis.

Abstract translation: 提供了一种可以快速测量样品的偏振特性的偏振分析装置。 所述偏振光分析装置包括被配置为发射预定波长区域的光的光源，被配置为透射从所述光源发射的光的偏振器，被配置为透射来自所述样品的光的空间相位调制器， 已经通过空间相位调制器的光和被配置为接收已经通过分析器的光的成像光谱仪。 空间相位调制器由双折射材料形成，并且被配置为在与光轴正交的平面中的第一方向上的各个位置处具有不同的相位差。 成像光谱仪将接收的光在与光轴正交的平面中与第一方向不同的第二方向分散。