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公开(公告)号：US20160209366A1
公开(公告)日：2016-07-21
申请号：US14915062
申请日：2014-08-29
Applicant: OSAKA UNIVERSITY
Inventor： Makoto KAWANO , Hitoshi WATARAI , Nobutoshi OTA
CPC classification number: G01N27/76 , G01N15/088 , G01N15/1031
Abstract: A calculation unit (40) obtains the volume magnetic susceptibility of a first particle. Also, the calculation unit (40) obtains the volume magnetic susceptibility of a second particle different from the first particle. Thereafter, the calculation unit (40) obtains a volume occupied by a surface material included in the second particle on the basis of a relationship between the volume magnetic susceptibility of the first particle, the volume of the first particle, the volume magnetic susceptibility of the second particle, the volume of the second particle, the volume occupied by the surface material, and the volume magnetic susceptibility of the surface material.
Abstract translation: 计算单元（40）获得第一粒子的体积磁化率。 此外，计算单元（40）获得与第一粒子不同的第二粒子的体积磁化率。 此后，计算单元（40）基于第一粒子的体积磁化率，第一粒子的体积，第一粒子的体积磁化率与第一粒子的体积磁化率之间的关系，求出包含在第二粒子中的表面材料所占据的体积 第二颗粒，第二颗粒的体积，表面材料占据的体积以及表面材料的体积磁化率。
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2.发明申请OBSERVATION APPARATUS, DEVICE, DEVICE PRODUCTION METHOD, PARTICLE SIZE MEASUREMENT METHOD, RESISTANCE OBSERVATION METHOD, CHEMICAL REACTION METHOD, PARTICLE PRESERVATION METHOD, AND AUTOMATIC OBSERVATION APPARATUS 审中-公开观察装置，装置，装置生产方法，颗粒尺寸测量方法，电阻观察方法，化学反应方法，颗粒保存方法和自动观测装置公开(公告)号：US20160349165A1
公开(公告)日：2016-12-01
申请号：US15114667
申请日：2015-01-28
Applicant: OSAKA UNIVERSITY
Inventor： Makoto KAWANO , Hitoshi WATARAI , Nobutoshi OTA
IPC: G01N15/02
CPC classification number: G01N15/0205 , G01J2009/0257 , G01N2015/025 , G01N2015/03 , G02F2001/213
Abstract: An observation apparatus (100) includes an observing optical system (101) capable of obtaining an image of a measurement target present in a gap included in a device (1). One end of the gap included in the device (1) is wider than the other end thereof, and upon light beam irradiation to the device (1), an interference fringe appears in the gap. The observing optical system (101) irradiates the gap included in the device (1) with a plurality of light beams having different wavelengths to cause a plurality of interference fringes to appear in the gap. Then the observing optical system (101) obtains an image of the plurality of interference fringes.
Abstract translation: 观察装置（100）包括能够获得包含在装置（1）中的间隙中存在的测量对象的图像的观察光学系统（101）。 包括在装置（1）中的间隙的一端比其另一端宽，并且在对装置（1）进行光束照射时，间隙中出现干涉条纹。 观察光学系统（101）利用具有不同波长的多个光束照射装置（1）中包括的间隙，从而在间隙中出现多个干涉条纹。 然后观察光学系统（101）获得多个干涉条纹的图像。
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