METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
    1.
    发明申请
    METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES 审中-公开
    用于模式样本的光学表征的方法和系统

    公开(公告)号:US20150316468A1

    公开(公告)日:2015-11-05

    申请号:US14265771

    申请日:2014-04-30

    Abstract: A method and system are presented for use in measuring on patterned samples, aimed at determining asymmetry in the pattern. A set of at least first and second measurements on a patterned region of a sample is performed, where each of the measurements comprises: directing illuminating light onto the patterned region along an illumination channel and collecting light reflected from the illuminated region propagating along a collection channel to be detected, such that detected light from the same patterned region has different polarization states which are different from polarization of the illuminating light, and generating a measured data piece indicative of the light detected in the measurement. Thus, at least first and second measured data pieces are generated for the at least first and second measurements on the same patterned region. The at least first and second measured data pieces are analyzed and output data is generated being indicative of a condition of asymmetry in the patterned region.

    Abstract translation: 提出了一种用于测量图案样品的方法和系统,旨在确定图案的不对称性。 执行在样本的图案化区域上的一组至少第一和第二测量,其中每个测量包括:沿着照明通道将照明光引导到图案化区域上,并收集从沿着收集通道传播的照明区域反射的光 以使得来自相同图案化区域的检测光具有不同于照明光的偏振的不同偏振态,并且产生指示在测量中检测到的光的测量数据。 因此,至少在相同图案区域上的至少第一和第二测量产生第一测量数据和第二测量数据。 分析至少第一和第二测量数据片段,并且生成指示图案化区域中的不对称条件的输出数据。

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