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    ULTRASONIC STRESS MEASUREMENT METHOD AND DEVICE
    1.
    发明申请
    ULTRASONIC STRESS MEASUREMENT METHOD AND DEVICE 有权
    超声压力测量方法和装置

    公开(公告)号：US20100162817A1

    公开(公告)日：2010-07-01

    申请号：US12646223

    申请日：2009-12-23

    申请人： Nobuo HARA ,  Yohei Takechi ,  Yutaka Omori

    发明人： Nobuo HARA ,  Yohei Takechi ,  Yutaka Omori

    IPC分类号： G01N29/14

    CPC分类号： G01N29/12 ,  G01N29/221 ,  G01N2291/02827 ,  G01N2291/044

    摘要： The present invention relates to an ultrasonic stress measurement method of measuring a residual stress of a measuring target layer in a measuring object using an ultrasonic wave, the method comprising, setting a plurality of vibration modes according to a number of degree of freedom of the measuring target layer in the measuring object, performing, for each vibration mode, a measurement operation of emitting an ultrasonic wave corresponding to the set vibration mode to the measuring target layer, receiving the ultrasonic wave reflected by the measuring target layer, and measuring an eigenfrequency of the measuring target layer, and measuring the residual stress of the measuring target layer based on plural measurement data of the eigenfrequency with respect to each vibration mode obtained by the measurement operation. The residual stress of the measuring object thus can be measured at higher accuracy.

    摘要翻译： 超声波应力测定方法技术领域本发明涉及使用超声波测定被测定物中的测定对象层的残留应力的超声波应力测定方法，该超声波应力测定方法包括根据测定的自由度的数量来设定多个振动模式 对于每个振动模式，对测量对象层进行与设定的振动模式对应的超声波的测量动作，接收被测量对象层反射的超声波，测定本体频率的本征频率 测量目标层，并且基于通过测量操作获得的每个振动模式的本征频率的多个测量数据来测量测量对象层的残余应力。 因此能够以更高的精度测量测量对象的残余应力。

    Ultrasonic stress measurement method and device
    2.
    发明授权
    Ultrasonic stress measurement method and device 有权
    超声波应力测量方法及装置

    公开(公告)号：US08181524B2

    公开(公告)日：2012-05-22

    申请号：US12646223

    申请日：2009-12-23

    申请人： Nobuo Hara ,  Yohei Takechi ,  Yutaka Omori

    发明人： Nobuo Hara ,  Yohei Takechi ,  Yutaka Omori

    IPC分类号： G01N29/14

    CPC分类号： G01N29/12 ,  G01N29/221 ,  G01N2291/02827 ,  G01N2291/044

    摘要： The present invention relates to an ultrasonic stress measurement method of measuring a residual stress of a measuring target layer in a measuring object using an ultrasonic wave, the method comprising, setting a plurality of vibration modes according to a number of degree of freedom of the measuring target layer in the measuring object, performing, for each vibration mode, a measurement operation of emitting an ultrasonic wave corresponding to the set vibration mode to the measuring target layer, receiving the ultrasonic wave reflected by the measuring target layer, and measuring an eigenfrequency of the measuring target layer, and measuring the residual stress of the measuring target layer based on plural measurement data of the eigenfrequency with respect to each vibration mode obtained by the measurement operation. The residual stress of the measuring object thus can be measured at higher accuracy.

    摘要翻译： 超声波应力测定方法技术领域本发明涉及使用超声波测定被测定物中的测定对象层的残留应力的超声波应力测定方法，该超声波应力测定方法包括根据测定的自由度的数量来设定多个振动模式 对于每个振动模式，对测量对象层进行与设定的振动模式对应的超声波的测量动作，接收被测量对象层反射的超声波，测定本体频率的本征频率 测量目标层，并且基于通过测量操作获得的每个振动模式的本征频率的多个测量数据来测量测量对象层的残余应力。 因此能够以更高的精度测量测量对象的残余应力。

    Quality evaluation method and quality evaluation apparatus
    3.
    发明授权
    Quality evaluation method and quality evaluation apparatus 有权
    质量评估方法和质量评估仪器

    公开(公告)号：US08885848B2

    公开(公告)日：2014-11-11

    申请号：US13108082

    申请日：2011-05-16

    申请人： Yohei Takechi ,  Yutaka Omori

    发明人： Yohei Takechi ,  Yutaka Omori

    IPC分类号： H03B29/00 ,  G10L25/00 ,  G06F1/20 ,  G01M13/02 ,  G01M13/04 ,  G10L15/02

    CPC分类号： G10L25/00 ,  G01M13/028 ,  G01M13/045 ,  G06F1/206 ,  G10L15/02

    摘要： Quality of industrial products is evaluated by evaluating non-stationary operation sound, which is a kind of operation sound, from an aspect of tone, using closely simulated evaluation levels of evaluation of non-stationary sound by used of a human sense of hearing.An operation sound of a conforming product sample is converted into sound waveform data by a sound collecting unit, and the sound waveform data is input into a computer via an A-D converter, and then converted into psychoacoustic parameters. Data of pseudo conforming products is additionally obtained from the psychoacoustic parameters of a plurality of conforming product samples by making use of deviation in the data of the conforming product samples. Threshold data is obtained using thresholds and masking data for evaluation calculated from psychoacoustic parameters of data of the conforming product samples and the pseudo conforming products by a statistical technique. An operation sound of a subject workpiece is converted into sound waveform data by the sound collecting unit, and the sound waveform data is input into the computer via the A-D converter, and then converted into psychoacoustic parameters. Each of the psychoacoustic parameters is compared with the corresponding one of the previously obtained threshold, and thereby the operation sound is evaluated.

    摘要翻译： 工业产品质量通过评估非平稳运行声音来评估，这是一种运用声音，从音调的角度，通过使用人的听觉来使用非稳定声音的评估的严密模拟评估水平。 合格产品样品的操作声音由声音采集单元转换成声音波形数据，声音波形数据通过A-D转换器输入计算机，然后转换成心理声学参数。 通过利用符合产品样本的数据的偏差，另外从多个符合产品样本的心理声学参数中获得伪符合产品的数据。 阈值数据是通过使用统计技术的阈值和用于评估的屏蔽数据获得的，该信息是通过符合产品样本的数据的心理声学参数和伪符合产物计算的。 被摄体工件的操作声音由声音采集单元转换为声音波形数据，声音波形数据通过A-D转换器输入计算机，然后转换为心理声学参数。 将每个心理声学参数与先前获得的阈值中的相应一个进行比较，从而评估操作声音。

    REFRACTIVE INDEX MEASURING APPARATUS
    4.
    发明申请
    REFRACTIVE INDEX MEASURING APPARATUS 有权
    折射指数测量装置

    公开(公告)号：US20110051127A1

    公开(公告)日：2011-03-03

    申请号：US12990547

    申请日：2010-01-21

    申请人： Yusuke Kusaka ,  Yohei Takechi ,  Atsushi Fukui ,  Seiji Hamano ,  Kazumasa Takata

    发明人： Yusuke Kusaka ,  Yohei Takechi ,  Atsushi Fukui ,  Seiji Hamano ,  Kazumasa Takata

    IPC分类号： G01N21/41

    CPC分类号： G01M11/0228

    摘要： By using two probe optical systems for measurement by disposing the probe optical systems with a test object sandwiched therebetween, an optical path length of light transmitted through the test object which is identified locally is calculated using an interference signal thereof. In addition, a geometrical thickness of the same part is calculated by measuring positions of the probe optical systems, whereby two calculated values are obtained. Based on the values and a calculated value for a reference object, a refractive index distribution of the test object is obtained.

    摘要翻译： 通过使用两个探测光学系统进行测量，通过将测试对象夹在其间设置探测光学系统，使用其干扰信号来计算通过本地识别的测试对象传输的光的光路长度。 此外，通过测量探针光学系统的位置来计算同一部分的几何厚度，由此获得两个计算值。 基于参考对象的值和计算值，获得测试对象的折射率分布。

    Refractive index measuring apparatus
    5.
    发明授权
    Refractive index measuring apparatus 有权
    折射率测量装置

    公开(公告)号：US08593624B2

    公开(公告)日：2013-11-26

    申请号：US12990547

    申请日：2010-01-21

    申请人： Yusuke Kusaka ,  Yohei Takechi ,  Atsushi Fukui ,  Seiji Hamano ,  Kazumasa Takata

    发明人： Yusuke Kusaka ,  Yohei Takechi ,  Atsushi Fukui ,  Seiji Hamano ,  Kazumasa Takata

    IPC分类号： G01N21/41

    CPC分类号： G01M11/0228

    摘要： By using two probe optical systems for measurement by disposing the probe optical systems with a test object sandwiched therebetween, an optical path length of light transmitted through the test object which is identified locally is calculated using an interference signal thereof. In addition, a geometrical thickness of the same part is calculated by measuring positions of the probe optical systems, whereby two calculated values are obtained. Based on the values and a calculated value for a reference object, a refractive index distribution of the test object is obtained.

    摘要翻译： 通过使用两个探测光学系统进行测量，通过将测试对象夹在其间设置探测光学系统，使用其干扰信号来计算通过本地识别的测试对象传输的光的光路长度。 此外，通过测量探针光学系统的位置来计算同一部分的几何厚度，由此获得两个计算值。 基于参考对象的值和计算值，获得测试对象的折射率分布。