公开(公告)号：US20230224655A1

公开(公告)日：2023-07-13

申请号：US18010631

申请日：2021-06-28

申请人： Nihon Onkyo Engineering Co., Ltd.

发明人： Hosei Kawagoe ,  Etsushi Fujita ,  Osamu Kohashi ,  Yoshio Tadahira ,  Shigeki Sugaya ,  Takahiro Mizuno ,  Shozo Suido ,  Shinji Ohashi

IPC分类号： H04R29/00 ,  H04R1/08 ,  H04R1/40 ,  H04R3/00

CPC分类号： H04R29/005 ,  H04R1/086 ,  H04R1/406 ,  H04R3/005

摘要： A time at which a failure of a noise level meter has occurred is accurately determined. The present invention relates to a noise measuring device including a noise level meter having a main microphone capable of measuring noise, and a sub microphone capable of measuring noise at the same time as the main microphone. The present invention also relates to a failure diagnosing system having the noise measuring device and a failure diagnosing device capable of diagnosing a failure of the main microphone. The present invention also relates to a failure diagnosing method for diagnosing a failure of the main microphone. In the failure diagnosing system and the method, the presence or absence of a failure of the main microphone in the noise level meter is diagnosed based on the comparison between main and sub noise data obtained by the main and sub microphones and respectively in each of a plurality of recording periods.