公开(公告)号：US5692510A

公开(公告)日：1997-12-02

申请号：US524843

申请日：1995-09-07

Applicant: Naama Gordon ,  Rafael Beyar ,  Samuel Sideman

Inventor： Naama Gordon ,  Rafael Beyar ,  Samuel Sideman

IPC: A61B5/00 ,  A61B5/026 ,  A61B5/0275 ,  A61B6/00

CPC classification number: A61B5/026 ,  A61B5/015 ,  A61B5/0275

Abstract: Methods for determining the flow rate of a substance within an object by extracting and mathematically manipulating numerical parameters from a thermoimaging temperature response curve of the surface of the object. The methods of the present invention are suitable to determine coronary arteries flow rates and myocardial perfusion rates in open chest conditions.

Abstract translation: 通过从物体表面的热成像温度响应曲线提取和数学地操作数值参数来确定物体内的物质的流速的方法。 本发明的方法适用于确定开放胸部条件下的冠状动脉血流速率和心肌灌注速率。

公开(公告)号：US5860922A

公开(公告)日：1999-01-19

申请号：US897423

申请日：1997-07-21

Applicant: Naama Gordon ,  Rafael Beyar ,  Samuel Sideman

Inventor： Naama Gordon ,  Rafael Beyar ,  Samuel Sideman

IPC: A61B5/00 ,  A61B5/026 ,  A61B5/0275

CPC classification number: A61B5/026 ,  A61B5/015 ,  A61B5/0275

Abstract: A method for determining a flow rate of a substance or a thermo-contrast agent in an object including a surface and an upstream region, and the method comprising the steps of (a) providing the upstream region with a thermo-contrast agent; (b) obtaining successive temperature readings of at least a part of the surface of the object; (c) generating a temperature response curve from the temperature readings; (d) extracting a parameter from the temperature response curve; and (e) determining the flow rate from the parameter.

Abstract translation: 一种用于确定包括表面和上游区域的物体中的物质或热造影剂的流速的方法，所述方法包括以下步骤：（a）向所述上游区域提供热造影剂; （b）获得物体表面的至少一部分的连续温度读数; （c）从温度读数产生温度响应曲线; （d）从温度响应曲线提取参数; 和（e）从该参数确定流量。

公开(公告)号：US06603873B1

公开(公告)日：2003-08-05

申请号：US09438577

申请日：1999-11-12

Applicant: Naama Gordon ,  Gadi Greenberg

Inventor： Naama Gordon ,  Gadi Greenberg

IPC: G06K903

CPC classification number: G06T7/0006 ,  G01N2021/95676 ,  G06T2207/30148

Abstract: A method and apparatus for inspecting isolated features on a reticle is provided wherein the isolated features are analyzed for defects globally as individual, whole features, rather than locally, pixel-by-pixel. In one embodiment, the reticle is imaged to produce pixels having a gray level, and an isolated feature is identified. An energy value for the isolated feature to be inspected is calculated by summing the gray levels of its pixels. A plurality of scatter values for the feature in different directions in the feature is calculated based on the equilibrium center of the feature to produce a unique “signature” for the inspected feature. The energy and scatter values of the inspected feature's signature are then compared with energy and scatter values associated with a corresponding reference feature to determine whether a defect exists in the inspected feature.

Abstract translation: 提供了用于检查掩模版上的隔离特征的方法和装置，其中分离的特征被全局地分析为单独的，整体特征，而不是逐个像素的局部缺陷。 在一个实施例中，将掩模版成像以产生具有灰度级的像素，并且识别孤立的特征。 通过对其像素的灰度级进行求和来计算要检查的孤立特征的能量值。 基于特征的平衡中心计算特征中不同方向上的特征的多个散射值，以产生用于被检查特征的唯一“签名”。 然后将检查特征的签名的能量和散射值与与相应的参考特征相关联的能量和散射值进行比较，以确定检查特征中是否存在缺陷。