SEMICONDUCTOR DEVICE WITH IMPROVED MECHANICAL STRESS RESISTANCE

    公开(公告)号:US20240204113A1

    公开(公告)日:2024-06-20

    申请号:US18082541

    申请日:2022-12-15

    Applicant: NXP B.V.

    CPC classification number: H01L29/866 H01L29/66106

    Abstract: Provided is a semiconductor device that includes: a semiconductor substrate having a first doped region of a first doping type and a second doped region of a second doping type, the first doped region being beneath but immediately adjacent to, the second doped region, with the first doping type being opposite the second doping type, thereby forming a junction region between the first doped region and the second doped region; and an additional layer that has been deposited above the junction region having similar mechanical properties as the semiconductor substrate. The additional layer covers at least 50% of a projection area of the junction region. The second doped region has a top surface, the additional layer has a bottom surface, and at least 90% of the bottom surface of the additional layer is electrically insulated from the top surface of the second doped region.

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