公开(公告)号：US11893721B2

公开(公告)日：2024-02-06

申请号：US16004916

申请日：2018-06-11

Applicant: NIKON-TRIMBLE CO., LTD.

Inventor： Yuichi Ohshima

IPC: G06T7/00 ,  G01B11/24 ,  G01B11/30 ,  G01C15/00 ,  G01N21/88 ,  G03B15/00 ,  G01C11/02 ,  G06T1/00 ,  H04N23/69 ,  G06T5/00 ,  G06T5/50

CPC classification number: G06T7/0004 ,  G01B11/24 ,  G01B11/30 ,  G01C11/02 ,  G01C15/00 ,  G01N21/88 ,  G01N21/8851 ,  G03B15/00 ,  G06T1/00 ,  G06T5/006 ,  G06T5/50 ,  H04N23/69 ,  G01C11/025

Abstract: A defect detection apparatus includes a defect detection unit and a calculation unit. The defect detection unit detects a defect that appears on an external appearance of a structure through imaging processing from external appearance image data that is generated by imaging the external appearance of the structure with a surveying instrument. The calculation unit calculates defect data relating to the defect detected by the defect detection unit by using coordinate data that is correlated with the external appearance image data.

公开(公告)号：US11132789B2

公开(公告)日：2021-09-28

申请号：US16620775

申请日：2017-06-14

Applicant: NIKON-TRIMBLE CO., LTD.

Inventor： Yuichi Ohshima

IPC: G06T7/70 ,  G06T7/00 ,  G06T7/60

Abstract: A target including a reference object of a known size is prepared. The reference object from target image data, which is generated by photographing the target using a survey instrument, is detected through image processing to calculate first size data on dimensions of the reference object. A defect from external appearance image data, which is generated by photographing an external appearance of a structure using the survey instrument, is detected through image processing to calculate defect data on dimensions of the defect. The first size data is compared with second size data on actual dimensions of the reference object to calculate correction data, which is used to correct the defect data.