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公开(公告)号:US20250123475A1
公开(公告)日:2025-04-17
申请号:US18991869
申请日:2024-12-23
Applicant: NIKON CORPORATION
Inventor: Satoshi IKEDA , Naoki Fukutake
Abstract: A microscope device (1) comprises: a first microscope part (10) including a first illumination optical system that irradiates a sample with a first illumination light toward a first direction and a first detection optical system that receives detection light from the sample in response to the irradiation with the first illumination light and guides the detection light to a first detector; and a second microscope part (50) including a second illumination optical system that irradiates the sample with a second illumination light toward a second direction and a second detection optical system that receives detection light from the sample in response to the irradiation with the second illumination light and guides the detection light to a second detector, the second direction being different from the first direction, wherein the microscope device comprises any one of the predetermined features.
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2.
公开(公告)号:US20240004176A1
公开(公告)日:2024-01-04
申请号:US18368621
申请日:2023-09-15
Applicant: NIKON CORPORATION
Inventor: Shota TSUCHIDA , Satoshi IKEDA
CPC classification number: G02B21/0056 , G01J9/00 , G01J9/0246 , G01J2009/0211 , G01J2009/0269
Abstract: A quantitative phase image generating method for a microscope, includes: irradiating an object with illumination light; disposing a focal point of an objective lens at each of a plurality of positions that are mutually separated by gaps Δz along an optical axis of the objective lens, and detecting light from the object; generating sets of light intensity distribution data corresponding to each of the plurality of positions based upon the detected light; and generating a quantitative phase image based upon the light intensity distribution data; wherein the gap Δz is set based upon setting information of the microscope.
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公开(公告)号:US20240411120A1
公开(公告)日:2024-12-12
申请号:US18808555
申请日:2024-08-19
Applicant: NIKON CORPORATION
Inventor: Naoki FUKUTAKE , Satoshi IKEDA
Abstract: A bright-field reflection microscope according to the present embodiment includes an illumination optical system that includes an aperture pattern turret that can form a plurality of annular illumination lights having annulus radiuses different from each other and an objective lens and illuminates the sample S with the illumination light; a detection optical system that gathers a first reflected light from the sample S and a second reflected light from an interface of surroundings of the sample S at the capturing device via the objective lens; and a control unit, and the capturing device detects the first reflected light and the second reflected light at each of the plurality of positions with different relative positions to the objective lens and the sample S by using each of the plurality of annular illumination lights formed by the control unit controlling the aperture pattern turret.
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公开(公告)号:US20220244516A1
公开(公告)日:2022-08-04
申请号:US17707096
申请日:2022-03-29
Applicant: NIKON CORPORATION
Inventor: Satoshi IKEDA , Naoki FUKUTAKE
Abstract: A microscope device (1) comprises an illumination optical system (10,20) for illuminating a sample, a detection optical system (40) for receiving light from the sample, a detector (60) for detecting the light from the sample via the detection optical system and outputting a detection signal of the light, a data processor (66) for generating at least one of a three-dimensional refractive index distribution and a two-dimensional phase distribution in the sample based on the detection signal output from the detector, and a modulation element group that is provided at a position of a pupil or a position conjugate with the pupil in only the illumination optical system, and has light transmittance changing continuously within a surface of the pupil or within a surface conjugate with the pupil.
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5.
公开(公告)号:US20200271910A1
公开(公告)日:2020-08-27
申请号:US15931995
申请日:2020-05-14
Applicant: NIKON CORPORATION
Inventor: Shota TSUCHIDA , Satoshi IKEDA
Abstract: A quantitative phase image generating method for a microscope, includes: irradiating an object with illumination light; disposing a focal point of an objective lens at each of a plurality of positions that are mutually separated by gaps Δz along an optical axis of the objective lens, and detecting light from the object; generating sets of light intensity distribution data corresponding to each of the plurality of positions based upon the detected light; and generating a quantitative phase image based upon the light intensity distribution data; wherein the gap Δz is set based upon setting information of the microscope.
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