ARRAY NEAR-FIELD HIGH OPTICAL SCATTERING MATERIAL DETECTION METHOD
    1.
    发明申请
    ARRAY NEAR-FIELD HIGH OPTICAL SCATTERING MATERIAL DETECTION METHOD 审中-公开
    阵列近场高光散射材料检测方法

    公开(公告)号:US20160320299A1

    公开(公告)日:2016-11-03

    申请号:US14697633

    申请日:2015-04-28

    Abstract: An array near-field high optical scattering material detection method is disclosed, which comprises steps of irradiating an input light onto a high scattering material to generate a diffuse reflection, a diffusion, and a transmission within the high scattering material; reading out an optical energy over different positions on the high scattering material, respectively; forming a two dimensional light intensity distribution data image according to the optical energy over different positions on the high scattering material, respectively; and analyzing an internal composition variation of the high scattering material according to the two dimensional light intensity distribution data image to obtain the internal composition data of the high scattering material. By using the above technical means, the internal composition of the high optical scattering material may be known by detecting the same, and may be successfully applied onto a detection use on the green technology involving the biomedical engineering, chemical engineering, and environmental engineering.

    Abstract translation: 公开了一种阵列近场高光散射材料检测方法,其包括将输入光照射到高散射材料上以在高散射材料内产生漫反射,扩散和透射的步骤; 分别在高散射材料上读出不同位置的光能; 根据高散射材料上不同位置上的光能分别形成二维光强分布数据图像; 并根据二维光强分布数据图像分析高散射材料的内部组成变化,以获得高散射材料的内部组成数据。 通过使用上述技术手段,通过检测高光散射材料的内部组成可以是已知的,可以成功地应用于涉及生物医学工程,化学工程和环境工程的绿色技术的检测用途。

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