公开(公告)号：US12176051B2

公开(公告)日：2024-12-24

申请号：US18193645

申请日：2023-03-31

Applicant: NANYA TECHNOLOGY CORPORATION

Inventor： Yi-Hsuan Chu

IPC: G11C29/00 ,  G11C29/12 ,  G11C29/36 ,  G11C29/46

Abstract: A test method is for testing a decision feedback equalization (DFE) of a memory device is provided. The memory device includes a memory bank. The test method includes: providing a first test data pattern having a first data transition frequency and a second test data pattern having a second data transition frequency different from the first data transition frequency; writing the first test data pattern into a first memory section of the memory bank with a first DFE; writing the second test data pattern into a second memory section of the memory bank with the first DFE; reading a first reading data pattern stored in the first memory section and a second reading data pattern stored in the second memory section; and generating a test result signal according to the first reading data pattern and the second reading data pattern.

公开(公告)号：US20240331791A1

公开(公告)日：2024-10-03

申请号：US18193645

申请日：2023-03-31

Applicant: NANYA TECHNOLOGY CORPORATION

Inventor： Yi-Hsuan Chu

IPC: G11C29/36 ,  G11C29/12 ,  G11C29/46

CPC classification number: G11C29/36 ,  G11C29/12015 ,  G11C29/46

Abstract: A test method is for testing a decision feedback equalization (DFE) of a memory device is provided. The memory device includes a memory bank. The test method includes: providing a first test data pattern having a first data transition frequency and a second test data pattern having a second data transition frequency different from the first data transition frequency; writing the first test data pattern into a first memory section of the memory bank with a first DFE; writing the second test data pattern into a second memory section of the memory bank with the first DFE; reading a first reading data pattern stored in the first memory section and a second reading data pattern stored in the second memory section; and generating a test result signal according to the first reading data pattern and the second reading data pattern.