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公开(公告)号:US20240320576A1
公开(公告)日:2024-09-26
申请号:US18578724
申请日:2021-07-20
Applicant: Mitsubishi Electric Corporation
Inventor: Shuhei FUJITA , Atsuko AOKI , Ai KOSHI , Yosuke NAKAYAMA
IPC: G06Q10/0631
CPC classification number: G06Q10/063114 , G06Q10/063116
Abstract: The object is to provide a technology for enabling creation of an appropriate operation plan in consideration of states of operators at work time and at non-work time. An obtaining unit obtains at least one of biological information or living behavior information of an operator at work time and at non-work time, attribute information on the operator, and production planning on the operator, a load estimator estimates a mental load amount on the operator, based on the at least one of the biological information or the living behavior information, and an operation plan creation unit creates an operation plan of the operator, based on the attribute information, the production planning, and the mental load amount.
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公开(公告)号:US20240255955A1
公开(公告)日:2024-08-01
申请号:US18290896
申请日:2021-07-28
Applicant: Mitsubishi Electric Corporation
Inventor: Yosuke NAKAYAMA , Hiroe TAKENAGA , Ai KOSHI , Shuhei FUJITA , Nobutoshi TODOROKI
IPC: G05D1/243 , G05D1/223 , G05D105/80 , G06F3/01 , G06T19/00
CPC classification number: G05D1/243 , G05D1/223 , G06F3/011 , G06T19/006 , G05D2105/89
Abstract: An object is to provide a technique to provide appropriate assistance for inspection work. An inspection work assistance apparatus includes a determination unit, an extraction unit, and a route creation unit. The determination unit determines whether any of the plurality of devices subject to inspection is a device with abnormality based on the inspection result. The extraction unit extracts an additional device for inspection related to the device with abnormality from the plurality of devices based on the related information related information that allows the plurality of devices to be related. The creation unit creates an inspection route passing through at least one of the plurality of devices subject to inspection and the additional device for inspection.
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