Abstract:
A system and method for converting a digital signal to an analog signal is provided. The present disclosure provides a digital-to-analog converter (DAC) that can convert a large bit value digital signal to a corresponding analog signal. In accordance with an embodiment, a method comprises receiving portions of a digital signal by a plurality of sub-DACs; converting the portions of the digital signal to a corresponding analog signal by the plurality of sub-DACs; biasing one or more of the plurality of sub-DACs; and calibrating the portions of a digital signal by one or more calibration elements.
Abstract:
This invention discloses a digital to analog converter (DAC) for converting a digital signal with a predetermined number of bits to a corresponding analog signal, the DAC comprises a first current source element having a first control signal, the first control signal controlling the conduction current provided by the first current source element, and a second current source element having a second control signal, the second control signal controlling the conduction current provided by the second current source element, wherein the first and the second control signals have different voltages during operation of the DAC.
Abstract:
A system for converting a digital signal to an analog signal is provided. The present invention provides a digital-to-analog converter (DAC) that can convert a large bit value digital signal to a corresponding analog signal. The digital-to-analog converter includes a bias regeneration circuit, and three sub-DACs. The bias regeneration circuit provides biasing to the three sub-DACs allowing the DAC to be implemented with smaller circuit area. In addition, the three sub-DACs may be digitally calibrated during the conversion process to increase the linearity of the DAC.
Abstract:
A system and method for converting a digital signal to an analog signal is provided. The present disclosure provides a digital-to-analog converter (DAC) that can convert a large bit value digital signal to a corresponding analog signal. In accordance with an embodiment, a method comprises receiving portions of a digital signal by a plurality of sub-DACs; converting the portions of the digital signal to a corresponding analog signal by the plurality of sub-DACs; biasing one or more of the plurality of sub-DACs; and calibrating the portions of a digital signal by one or more calibration elements.
Abstract:
A system for converting a digital signal to an analog signal is provided. The present invention provides a digital-to-analog converter (DAC) that can convert a large bit value digital signal to a corresponding analog signal. The digital-to-analog converter includes a bias regeneration circuit, and three sub-DACs. The bias regeneration circuit provides biasing to the three sub-DACs allowing the DAC to be implemented with smaller circuit area. In addition, the three sub-DACs may be digitally calibrated during the conversion process to increase the linearity of the DAC.
Abstract:
This invention discloses a digital to analog converter (DAC) for converting a digital signal with a predetermined number of bits to a corresponding analog signal, the DAC comprises a first current source element having a first control signal, the first control signal controlling the conduction current provided by the first current source element, and a second current source element having a second control signal, the second control signal controlling the conduction current provided by the second current source element, wherein the first and the second control signals have different voltages during operation of the DAC.
Abstract:
A method includes generating a first current, wherein the first current flows through a first resistor and a first bipolar transistor. A first end of the first resistor is serially connected to an emitter-collector path of the first bipolar transistor, and a second end of the resistor is connected to an input of an operational amplifier. A second current is generated to flow through a second resistor that is connected to the input of the operational amplifier. An emitter of a second bipolar transistor is connected to a base of the first bipolar transistor, wherein a base and a collector of the second bipolar transistor are connected to VSS. The first and the second currents are added to generate a third current, which is mirrored to generate a fourth current proportional to the third current. The fourth current is conducted through a third resistor to generate an output reference voltage.
Abstract:
A driver utilizes selective biasing of the terminal of an operational amplifier to reduce offset in the operational amplifier output. Each operational amplifier input includes a differential input pair of transistors including a NMOS transistor and PMOS transistor. At low and high ends of the input voltage range these transistors are selectively and individually coupled to either a standard input or biased to be on so as to contribute offset for offset compensation. The transistors are biased in a conventional manner for input voltages between the low and high ends of the voltage range.
Abstract:
A digital-to-analog converter (DAC) for converting a digital signal to an analog signal includes a first thermometer decoder and a second thermometer decoder. The first thermometer decoder is configured to decode most-significant bits (MSBs) of the digital signal to generate a first thermometer code. The second thermometer decoder is configured to decode middle bits of the digital signal to generate a second thermometer code. The DAC further includes a plurality of macro cells with each controlled by one bit of the first thermometer code. The plurality of macro cells is configured to provide a first analog signal according to the first thermometer code. The DAC further includes a macro cell configured to provide a second analog signal according to the second thermometer code. The macro cell is further configured to provide a third analog signal according to least-significant bits (LSBs) of the digital signal.
Abstract:
Among other things, one or more techniques for graded dummy insertion and a resulting array are provided herein. For example an array is a metal oxide semiconductor (MOS) array, a metal oxide metal (MOM) array, or a resistor array. In some embodiments, a first region and a second region are identified based on a density gradient between a first pattern density associated with the first region and a second pattern density associated with the second region. For example, the first pattern density and the second pattern density are gate densities and/or poly densities. To this end, a dummy region is inserted between the first region and the second region, the dummy region includes a graded pattern density based on a first adjacent pattern density and a second adjacent pattern density. In this manner, graded dummy insertion is provided, thus enhancing edge cell performance for an array, for example.