Abstract:
An apparatus, a method, and a computer program are provided to gate a Phased Locked Loop (PLL). In microprocessors, the clock distribution system can account for a substantial amount of power consumption. Gating the PLLs, however, has been difficult because of the usual requirement for a separate clock for control logic and because the PLL requires timed to reacquire phase/frequency lock. Therefore, lock detection logic can be employed to allow the PLL to reacquire phase/frequency lock. Additionally, signals from external devices and the processor can be employed to gate the PLL and allow the processor to be awakened without a need for a separate clock.
Abstract:
An eFuse system that includes a mechanism that bridges banks of eFuses and allows the banks of eFuses to be placed any distance from each other. The bridging of the eFuse banks is transparent to compression and encode programming algorithm and hardware decode mechanisms. Thus, by using the mechanism for bridging gaps between eFuse banks, an eFuse subsystem with several banks distributed on an integrated circuit chip appears to be a single large eFuse bank to the encode/decode mechanisms of the integrated circuit. Additionally, with this mechanism, eFuse banks can be easily added or deleted.
Abstract:
An apparatus, a method, and a computer program are provided to disable clock distribution. In microprocessors, the clock distribution system can account for a substantial amount of power consumption. Disabling the clock distribution system, however, has been difficult because of the usual requirement for a separate clock for control logic. Therefore, combinational logic can be employed to disrupt the clock distribution and allow a processor to be awakened without a need for a separate clock.
Abstract:
The present invention provides for reducing current spikes in a circuit when changing clocking frequencies. A first frequency is applied to a clock distribution network. A final frequency is selected. The first frequency is applied to a logic element over the clock distribution network. A hold signal is applied to the logic element. The clock rate of the clock distribution network is changed from the first frequency to the final frequency. The hold signal is unapplied to the logic element.
Abstract:
The present invention provides for reducing current spikes in a circuit when changing clocking frequencies. A first frequency is applied to a clock distribution network. A final frequency is selected. The first frequency is applied to a logic element over the clock distribution network. A hold signal is applied to the logic element. The clock rate of the clock distribution network is changed from the first frequency to the final frequency. The hold signal is unapplied to the logic element.
Abstract:
The present invention provides for reducing current spikes in a circuit when changing clocking frequencies. A first frequency is applied to a clock distribution network. A final frequency is selected. The first frequency is applied to a logic element over the clock distribution network. A hold signal is applied to the logic element. The clock rate of the clock distribution network is changed from the first frequency to the final frequency. The hold signal is unapplied to the logic element.
Abstract:
A method, an apparatus, and a computer program are provided to reduce transient current swings during mode transitions. Traditionally, transient supply voltage fluctuations on a chip account for a large portion of the power supply. The number of series inductances and resistances are typically minimized, while adding large decoupling capacitances between the supply voltage and ground. However, situations may arise where reduction of series inductances and resistances cannot be accomplished. Therefore, to assist in controlling the transient current swings, reduction of clocking frequencies are performed in a controlled manner.
Abstract:
A system and method for advanced logic built-in self test with selection of scan channels is present. An LBIST controller loads scan patterns into a device's scan channels through sequential or interleaved loading techniques in order to minimize instantaneous power requirements. During interleave loading, the LBIST controller loads a scan bit into a first scan chain, then into a second scan chain, etc. until one bit is loaded into each scan chain. The LBIST controller then returns to load another scan bit into the first scan channel, then the second scan channel, etc. During sequential loading, the LBIST controller loads an entire scan pattern into a first scan chain (one bit per clock cycle). Once the first scan pattern is loaded, the LBIST controller proceeds to load subsequent scan patterns into corresponding scan chains on a one bit per scan channel per clock cycle basis.
Abstract:
Provided is an apparatus that includes a processor comprising a plurality of processing cores and a corresponding plurality of LBIST modules, each LBIST module corresponding to one of the plurality of processing cores; a MISR read out connection, comprising a compare value register, a plurality of MISR registers equal in number to the plurality of cores, each MISR register corresponding to one of the plurality of processing cores and a corresponding plurality of XOR logic gates, each XOR logic gate coupled to the compare value register and a corresponding one of the MISR registers and configured to signal whether or not the event the compare value register and the corresponding MISR register match and logic, stored and executed on the processor, for transmitting the signals generated by the plurality of XOR logic gates.
Abstract:
A mechanism is provided for using a single bank of electric fuses (eFuses) to successively store test data derived from multiple stages of testing are provided. To encode and store array redundancy data from each subsequent test in the same bank of eFuses, a latch on a scan chain is used that holds the programming information for each eFuse. This latch allows for programming only a portion of eFuses during each stage of testing. Moreover, the data programmed in the eFuses can be sensed and read as part of a scan chain. Thus, it can be easily determined what portions of the bank of eFuses have already been programmed by a previous stage of testing and where to start programming the next set of data into the bank of eFuses. As a result, the single bank of eFuses stores multiple sets of data from a plurality of test stages.