Abstract:
There is disclosed a hermetically sealed semiconductor package which is physically thin, allowing mounting within apertures formed in printed circuit boards which are stacked one on top of another in a high density configuration. The hermetic seal is made to a planar surface resulting in high reliability devices in which the leads to the interior of the package are made through ''''cross under'''' regions which are provided with planar top surfaces. The ''''cross under'''' region is a region of extremely low resistivity, high temperature material. Because this material is utilized as part of the lead to the device and because the hermetic seal is made on top of the ''''cross under,'''' higher temperatures, which would ordinarily destroy metal leads, can be applied to the sealing material both on top of the ''''cross unders'''' and on top of the substrate for increasing the reliability of the seal. This package replaces the more fragile prior art hermetically sealed devices which include a number of piece parts. A device packaged in the subject manner is also used as a hermetically sealed substitute for beam lead devices, since the subject devices are thin, have a higher reliability than unsealed beam lead devices and are impervious to welding and other contaminants during mounting.