公开(公告)号：US20140140182A1

公开(公告)日：2014-05-22

申请号：US13680497

申请日：2012-11-19

Applicant: LSI CORPORATION

Inventor： Scott M. Dziak ,  Ming Jin ,  Jonathan Dykhuis

IPC: G11B27/36

CPC classification number: G11B27/36 ,  G11B20/182 ,  G11B2220/2516

Abstract: The disclosure is directed to a system and method for detecting and classifying at least one media defect. A periodic pattern is written to a medium to yield at least one waveform. The magnitude of the waveform is compared against a defect threshold to detect the presence or absence of media defects in the medium. When at least one defect is detected, a magnitude for each of at least two harmonics of the waveform is determined in the defect range. The defect is classified by comparing a ratio of the magnitudes of the at least two harmonics against a classification threshold.

Abstract translation: 本公开涉及用于检测和分类至少一个介质缺陷的系统和方法。 将周期性图案写入介质以产生至少一个波形。 将波形的大小与缺陷阈值进行比较，以检测介质中是否存在介质缺陷。 当检测到至少一个缺陷时，在缺陷范围内确定波形的至少两个谐波中的每一个的幅度。 通过比较至少两个谐波的幅度与分类阈值的比值来分类缺陷。

公开(公告)号：US08811136B2

公开(公告)日：2014-08-19

申请号：US13680497

申请日：2012-11-19

Applicant: LSI Corporation

Inventor： Scott M. Dziak ,  Ming Jin ,  Jonathan Dykhuis

IPC: G11B7/00 ,  G11B27/36

CPC classification number: G11B27/36 ,  G11B20/182 ,  G11B2220/2516

Abstract: The disclosure is directed to a system and method for detecting and classifying at least one media defect. A periodic pattern is written to a medium to yield at least one waveform. The magnitude of the waveform is compared against a defect threshold to detect the presence or absence of media defects in the medium. When at least one defect is detected, a magnitude for each of at least two harmonics of the waveform is determined in the defect range. The defect is classified by comparing a ratio of the magnitudes of the at least two harmonics against a classification threshold.

Abstract translation: 本公开涉及用于检测和分类至少一个介质缺陷的系统和方法。 将周期性图案写入介质以产生至少一个波形。 将波形的大小与缺陷阈值进行比较，以检测介质中是否存在介质缺陷。 当检测到至少一个缺陷时，在缺陷范围内确定波形的至少两个谐波中的每一个的幅度。 通过比较至少两个谐波的幅度与分类阈值的比值来分类缺陷。