Abstract:
A system for coupling at least one optical beam includes at least one optical beam entry port, an optical beam exit port, the optical beam exit port including a lens performing a Fourier Transform, at least one optical beam deflector, and an optical base element, wherein the at least one directly fixed optical beam deflector is allowed to rotate around a rotation axis, wherein the corresponding at least one optical beam and/or its assigned optical beam entry port is configured such that the semi-major axis of the elliptical cross section of the optical beam on a deflection surface of a respective optical beam deflector is oriented parallel to the rotation axis, and wherein, after having passed the optical beam exit port, the elliptical cross section of the at least one optical beam overlaps the circular cross section of the light receiver.
Abstract:
A laser scanning microscope includes a light source configured to emit an illumination light beam. The illumination light beam has a transverse light intensity profile comprising an intensity minimum. The laser scanning microscope further includes a scanning device configured to scan the illumination light beam along a closed trajectory in a target area of a specimen, and a detector configured to detect fluorescence light emitted by a fluorophore within the target area of the specimen. The fluorophore is excited by the illumination light beam. The laser scanning microscope further includes a processor configured to determine an intensity distribution of the fluorescence light as a function of time and to determine a position of the fluorophore within the target area based on the intensity distribution of the fluorescence light.
Abstract:
A method for illumination and detection in RESOLFT microscopy using a pulsed or continuous light source for excitation light and switching light is characterized in that the excitation light (4) is irradiated in pulses and in that the pulse of the excitation light (4) is longer than 150 picoseconds, preferably up to a few hundred picoseconds, and even up to a few nanoseconds. A corresponding apparatus uses the method according to the present invention.
Abstract:
A fluorescence microscope includes excitation and de-excitation light sources designed to generate excitation and de-excitation light distributions, which excite and de-excite fluorophores present in a sample, respectively. An illumination unit is designed to combine the light distributions such that an intensity maximum of the excitation light distribution and an intensity minimum of the de-excitation light distribution are spatially superimposed on one another in an illumination target point. A detector is designed to detect the fluorescence photons as a function of their arrival times. The processor is designed to evaluate the detected fluorescence photons with respect to their arrival times and, based thereon, to control a delay which a light pulse or a light modulation of the de-excitation light distribution has at a position of the illumination target point in relation to a light pulse or a light modulation of the excitation light distribution.
Abstract:
A fluorescence scanning microscope includes excitation and de-excitation light sources, which are designed to generate an excitation and a de-excitation light distribution, respectively. An illumination unit combines the light distributions to form a light distribution scanning over multiple illumination target points of a sample in such a way that an intensity maximum of the excitation light distribution and an intensity minimum of the de-excitation light distribution are spatially superimposed on one another. A detector detects fluorescence photons emitted from the respective illumination target point as a function of their arrival times. A processor evaluates the fluorescence photons with respect to the arrival times, generates a first pixel and a second pixel based thereon, assembles the first and second pixels to form first and second sample images, respectively, and, by means of the two sample images, determines a spatial offset between the intensity maximum and the intensity minimum.
Abstract:
A light-microscopy method for locating point objects in a sample arranged in an object space includes imaging the sample onto a detector by an imaging optical unit having a depth of field of predetermined axial extent along an optical axis in the object space, onto which the detector is imaged. The point objects in the sample are located within the depth of field. The first sample image generated by the imaging of the sample onto the detector is evaluated. For locating a respective first point object in a direction of the optical axis, a parameter of a first light spot of one or more light spots of the first sample image representing the first point object is determined, and a rough axial z position related to the first point object is assigned to the parameter based on predetermined association information.