公开(公告)号：US20240004179A1

公开(公告)日：2024-01-04

申请号：US18337098

申请日：2023-06-19

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Falk SCHLAUDRAFF ,  Florian HOFFMANN

IPC: G02B21/32 ,  G02B21/00

CPC classification number: G02B21/32 ,  G02B21/008 ,  G02B21/0036 ,  G02B21/0032

Abstract: A sample manipulation device includes a manipulation light source configured to emit manipulation light, an objective configured to focus the manipulating light onto the sample to form a manipulation light beam, a scanning unit configured to move the manipulation light beam within a field of view of the objective, a sample positioning unit configured to move the sample relative to an optical axis of the objective, and a controller configured to receive manipulation data comprising at least one manipulation path, upon determining that the manipulation path is entirely outside the predetermined area, control the manipulation light source and the scanning unit such that the sample is manipulated along the manipulation path, and upon determining that at least a part of the manipulation path is inside the predetermined area, control the sample positioning unit to move the sample such that the manipulation path is entirely outside the predetermined area.

公开(公告)号：US20220136936A1

公开(公告)日：2022-05-05

申请号：US17424521

申请日：2020-01-23

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Florian HOFFMANN ,  Falk SCHLAUDRAFF

IPC: G01N1/28 ,  G02B19/00

Abstract: A method for laser microdissection includes: processing a microscopic examination object by a laser beam using tuples of coordinate values which respectively indicate positions of target points on the examination object at least in a first spatial direction and a second spatial direction orthogonal to the first spatial direction, positions of at least three reference points being ascertained beforehand in each case in the first and second spatial directions and also in a third spatial direction orthogonal to the first and second spatial directions; defining a reference plane based on the positions of the reference points; and determining, for the target points, further coordinate values indicating an expected position of the target points on the examination object in the third spatial direction in each case, as determined further coordinate values, the determining of the further coordinate values being performed depending on the defined reference plane.