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公开(公告)号:US11476116B2
公开(公告)日:2022-10-18
申请号:US17358284
申请日:2021-06-25
Inventor: Dae-Woo Jeon , Ji-Hyeon Park
IPC: H01L21/02 , H01L21/265
Abstract: Disclosed is a method of manufacturing a gallium oxide thin film for a power semiconductor using a dopant activation technology that maximizes dopant activation effect and rearrangement effect of lattice in a grown epitaxial at the same time by performing in-situ annealing in a growth condition of a nitrogen atmosphere at the same time as the growth of a doped layer is finished.