MEASUREMENT METHOD AND APPARATUS FOR SIMULTANEOUS CORRECTION OF DISTURBANCE AND OFFSET OF SENSOR

    公开(公告)号:US20180180650A1

    公开(公告)日:2018-06-28

    申请号:US15702539

    申请日:2017-09-12

    CPC classification number: G01R15/205 G01R15/202 G01R33/0029 G01R33/07

    Abstract: A measurement method and apparatus for correcting a disturbance and an offset of a sensor simultaneously are described. The method includes applying a bias current to first and second sensors of a Wheatstone bridge type connected with each other as a differential structure, and measuring a voltage of the first sensor and a voltage of the second sensor. The method also includes applying a bias current to the first and second sensors in a direction opposite to the direction in the first applying, and measuring a voltage of the first sensor and a voltage of the second sensor. The method further includes calculating a final measurement value based on the measured voltages. Accordingly, the offset and the influence of the disturbance of the sensor can be simultaneously removed through one circuit, such that advantageous effects such as reduced complexity, reduced area/volume, and shortened correction time can be achieved.

    SELF-REFERENCE POINT SETTING TYPE BLOOD COMPONENT MEASURING METHOD AND APPARATUS

    公开(公告)号:US20210196158A1

    公开(公告)日:2021-07-01

    申请号:US17137924

    申请日:2020-12-30

    Abstract: This application relates to a self-reference point setting type blood component measuring method and apparatus using light. In one aspect, the method includes applying light to a skin of a subject to be measured and setting a reference point on a surface of the skin adjacent to a point at which the light is applied. The method further includes calculating a concentration of a blood component from a light intensity measured at the reference point and a light intensity measured at another point. According to some embodiments, the accuracy and precision of measurement are increased in measuring blood in a non-invasive manner.

    METHOD AND APPARATUS FOR CALCULATING OFFSET OF WHEATSTONE BRIDGE TYPE SENSOR

    公开(公告)号:US20180180700A1

    公开(公告)日:2018-06-28

    申请号:US15702578

    申请日:2017-09-12

    CPC classification number: G01R35/005 G01R17/105 G01R33/07

    Abstract: A method and an apparatus for calculating an offset of a Wheatstone bridge type sensor are described. The offset calculation method includes measuring resistances between nodes of a Wheatstone bridge type sensor, calculating an offset of the sensor using the measured resistances and providing information on the calculated offset. Accordingly, the offset of the Wheatstone bridge type sensor can be rapidly and easily calculated independently from the size of a bias current, and ultimately. Furthermore, time required to measure can be reduced and thus a sensor fabrication cost can be reduced, and also, mass production can be enhanced.

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