-
公开(公告)号：US20100066396A1
公开(公告)日：2010-03-18
申请号：US12517040
申请日：2007-03-20
申请人： Kiyotoshi Miura , Hitoshi Sato , Akihisa Akahira
发明人： Kiyotoshi Miura , Hitoshi Sato , Akihisa Akahira
IPC分类号： G01R31/02
CPC分类号： G01R31/2889
摘要： An electrical connecting apparatus for use in electrical measurement of a device under test comprises a supporting member and a flat plate-like probe base plate. On one surface of the probe base plate are provided multiple probes abutting on electrical connecting terminals of the device under test undergoing an electrical test. Also, on the other surface of the probe base plate is formed a securing portion provided with a screw hole opened at the top portion. It further has a generally cylindrical spacer and a screw member passing through the spacer and whose tip end is screwed in the screw hole of the securing portion. As for the spacer, movement in the axial direction is restricted in relation to the supporting member by a restricting means. The spacer has a head portion whose underside is mounted on the other surface of the supporting member and a body portion communicating with the head portion at one end, arranged to pass through a through hole formed in the supporting member, and whose other end is arranged to abut on the top face of the securing portion.
摘要翻译： 用于被测设备的电测量的电连接装置包括支撑构件和平板状探针基板。 在探针基板的一个表面上设置有多个探针，它们与经过电气测试的被测器件的电连接端子相邻。 此外，在探针基板的另一个表面上形成有设置有在顶部开口的螺纹孔的固定部。 它还具有通常为圆柱形的间隔件和通过间隔件的螺钉构件，并且其末端拧入固定部分的螺钉孔中。 对于间隔件，通过限制装置相对于支撑构件限制轴向的移动。 间隔件具有头部，其下侧安装在支撑构件的另一个表面上，主体部分在一端与头部连通，布置成穿过形成在支撑构件中的通孔，并且其另一端布置 以抵靠固定部分的顶面。
-
2.发明授权公开(公告)号：US07667472B2
公开(公告)日：2010-02-23
申请号：US11912872
申请日：2005-05-23
CPC分类号： G01R31/2889 , G01R1/07314 , Y10T29/49204
摘要： A probe assembly for use in electrical measurement of a device under test. The probe assembly comprises a plate-like probe base plate with bending deformation produced in a free state without load, and a plurality of probes formed on one face of the probe base plate to project from the face. All the tips of the probes are positioned on the same plane parallel to an imaginary reference plane of the probe base plate.
摘要翻译： 用于被测设备的电测量的探针组件。 探针组件包括在空载状态下产生的具有弯曲变形的板状探针基板，以及形成在探针基板的一个面上的多个探针，以从面部突出。 探针的所有尖端位于平行于探针基板的虚拟参考平面的同一平面上。
-
公开(公告)号：US20090160469A1
公开(公告)日：2009-06-25
申请号：US12300784
申请日：2006-06-02
申请人： Kiyotoshi Miura , Hitoshi Sato
发明人： Kiyotoshi Miura , Hitoshi Sato
IPC分类号： G01R31/02
CPC分类号： G01R31/2889 , G01R31/2874
摘要： In an electrical connecting apparatus, a thermal deformation restriction member, a reinforcing plate, and an auxiliary member are made of materials having smaller thermal expansion coefficients in this order, and a wiring board supporting a probe assembly is coupled with the reinforcing plate. The auxiliary member has a void inside the coupling region with the reinforcing plate. The void receives the deformed part when the center portion of the wiring board is deformed toward the reinforcing plate. Thus, the thermal deformation restriction member, the reinforcing plate, and the auxiliary member function as a three-layer bimetal having a sandwich structure, and the thermal deformation of the wiring board is restricted effectively.
摘要翻译： 在电连接装置中，热变形限制构件，加强板和辅助构件由具有较小热膨胀系数的材料依次构成，并且支撑探针组件的布线板与加强板联接。 辅助构件在与加强板的联接区域内具有空隙。 当布线板的中心部朝向加强板变形时，空隙容纳变形部。 因此，热变形限制构件，加强板和辅助构件作为具有夹层结构的三层双金属，并且布线板的热变形被有效地限制。
-
公开(公告)号：US07924034B2
公开(公告)日：2011-04-12
申请号：US12300784
申请日：2006-06-02
申请人： Kiyotoshi Miura , Hitoshi Sato
发明人： Kiyotoshi Miura , Hitoshi Sato
IPC分类号： G01R31/02
CPC分类号： G01R31/2889 , G01R31/2874
摘要： In an electrical connecting apparatus, a thermal deformation restriction member, a reinforcing plate, and an auxiliary member are made of materials having smaller thermal expansion coefficients in this order, and a wiring board supporting a probe assembly is coupled with the reinforcing plate. The auxiliary member has a void inside the coupling region with the reinforcing plate. The void receives the deformed part when the center portion of the wiring board is deformed toward the reinforcing plate. Thus, the thermal deformation restriction member, the reinforcing plate, and the auxiliary member function as a three-layer bimetal having a sandwich structure, and the thermal deformation of the wiring board is restricted effectively.
摘要翻译： 在电连接装置中，热变形限制构件，加强板和辅助构件由具有较小热膨胀系数的材料依次构成，并且支撑探针组件的布线板与加强板联接。 辅助构件在与加强板的联接区域内具有空隙。 当布线板的中心部朝向加强板变形时，空隙容纳变形部。 因此，热变形限制构件，加强板和辅助构件作为具有夹层结构的三层双金属，并且布线板的热变形被有效地限制。
-
公开(公告)号：US07859282B2
公开(公告)日：2010-12-28
申请号：US12517040
申请日：2007-03-20
申请人： Kiyotoshi Miura , Hitoshi Sato , Akihisa Akahira
发明人： Kiyotoshi Miura , Hitoshi Sato , Akihisa Akahira
IPC分类号： G01R31/02
CPC分类号： G01R31/2889
摘要： An electrical connecting apparatus for use in electrical measurement of a device under test comprises a supporting member and a flat plate-like probe base plate. On one surface of the probe base plate are provided multiple probes abutting on electrical connecting terminals of the device under test undergoing an electrical test. Also, on the other surface of the probe base plate is formed a securing portion provided with a screw hole opened at the top portion. It further has a generally cylindrical spacer and a screw member passing through the spacer and whose tip end is screwed in the screw hole of the securing portion. As for the spacer, movement in the axial direction is restricted in relation to the supporting member by a restricting means. The spacer has a head portion whose underside is mounted on the other surface of the supporting member and a body portion communicating with the head portion at one end, arranged to pass through a through hole formed in the supporting member, and whose other end is arranged to abut on the top face of the securing portion.
摘要翻译： 用于被测设备的电测量的电连接装置包括支撑构件和平板状探针基板。 在探针基板的一个表面上设置有多个探针，它们与经过电气测试的被测器件的电连接端子相邻。 此外，在探针基板的另一个表面上形成有设置有在顶部开口的螺纹孔的固定部。 它还具有通常为圆柱形的间隔件和通过间隔件的螺钉构件，并且其末端拧入固定部分的螺钉孔中。 对于间隔件，通过限制装置相对于支撑构件限制轴向的移动。 间隔件具有头部，其下侧安装在支撑构件的另一个表面上，主体部分在一端与头部连通，布置成穿过形成在支撑构件中的通孔，并且其另一端布置 以抵靠固定部分的顶面。
-
公开(公告)号：US07843198B2
公开(公告)日：2010-11-30
申请号：US11995459
申请日：2005-08-02
申请人： Hitoshi Sato , Kiyotoshi Miura
发明人： Hitoshi Sato , Kiyotoshi Miura
CPC分类号： G01R31/2889
摘要： An electrical connecting apparatus for use in an electrical inspection of a tester and a device under test. The electrical connecting apparatus is provided with a probe assembly to be tightened by tightening screw members toward the support member and having a wiring board interposed between itself and a support member. In order to prevent deformation of the probe board of the probe assembly due to tightening of the screw members, a spacer disposed to penetrate the wiring board is between the support member and probe board and penetrated by the screw members. Both end faces of the spacer are convex spherical surface.
摘要翻译： 一种用于测试仪和被测设备的电气检查的电气连接装置。 电连接装置设置有通过将螺钉构件紧固到支撑构件并且具有插入其本身和支撑构件之间的配线板来紧固的探针组件。 为了防止由于螺钉构件的紧固导致探头组件的探针板的变形，穿过布线板的间隔件位于支撑构件和探针板之间并被螺钉构件穿透。 间隔件的两个端面均为凸形球面。
-
公开(公告)号：US20100134121A1
公开(公告)日：2010-06-03
申请号：US11995459
申请日：2005-08-02
申请人： Hitoshi Sato , Kiyotoshi Miura
发明人： Hitoshi Sato , Kiyotoshi Miura
IPC分类号： G01R31/04
CPC分类号： G01R31/2889
摘要： An electrical connecting apparatus for use in an electrical inspection of a tester and a device under test. The electrical connecting apparatus is provided with a probe assembly to be tightened by tightening screw members toward the support member and having a wiring board interposed between itself and a support member. In order to prevent deformation of the probe board of the probe assembly due to tightening of the screw members, a spacer disposed to penetrate the wiring board is between the support member and probe board and penetrated by the screw members. Both end faces of the spacer are convex spherical surface.
摘要翻译： 一种用于测试仪和被测设备的电气检查的电气连接装置。 电连接装置设置有通过将螺钉构件紧固到支撑构件并且具有插入其本身和支撑构件之间的配线板来紧固的探针组件。 为了防止由于螺钉构件的紧固导致探头组件的探针板的变形，穿过布线板的间隔件位于支撑构件和探针板之间并被螺钉构件穿透。 间隔件的两个端面均为凸形球面。
-
8.发明申请公开(公告)号：US20090058440A1
公开(公告)日：2009-03-05
申请号：US11912872
申请日：2005-05-23
CPC分类号： G01R31/2889 , G01R1/07314 , Y10T29/49204
摘要： A probe assembly for use in electrical measurement of a device under test. The probe assembly comprises a plate-like probe base plate with bending deformation produced in a free state without load, and a plurality of probes formed on one face of the probe base plate to project from the face. All the tips of the probes are positioned on the same plane parallel to an imaginary reference plane of the probe base plate.
摘要翻译： 用于被测设备的电测量的探针组件。 探针组件包括在空载状态下产生的具有弯曲变形的板状探针基板，以及形成在探针基板的一个面上的多个探针，以从面部突出。 探针的所有尖端位于平行于探针基板的虚拟参考平面的同一平面上。
-
公开(公告)号：US07843204B2
公开(公告)日：2010-11-30
申请号：US12332242
申请日：2008-12-10
IPC分类号： G01R31/02
CPC分类号： G01R1/07307
摘要： The object of the present invention is to prevent an operator from touching electronic elements arranged on an upper surface of a probe assembly of an electrical connecting apparatus at the time of carrying the electrical connecting apparatus and to restrict bowing of the probe assembly caused by the temperature difference between the upper surface and the lower surface of the probe assembly. An electrical connecting apparatus 10 comprises a probe assembly having a plurality of contactors 14 on a lower surface and a plurality of electronic elements 18 arranged on an upper surface, a cover 32 arranged on the upper surface of the probe assembly so as to close a space 30 in which the electronic elements are arranged, and two grippers 42 attached to the cover. Each gripper 42 has one end 42a and the other end 42a, has a region ranging from one end to the other end formed approximately in a U-shape, and is attached to a main body portion 33 of the cover at both the ends.
摘要翻译： 本发明的目的是防止操作员在携带电连接装置时接触布置在电连接装置的探头组件的上表面上的电子元件，并且限制由温度引起的探头组件的弯曲 探针组件的上表面和下表面之间的差异。 电连接装置10包括探针组件，其具有在下表面上的多个接触器14和布置在上表面上的多个电子元件18，布置在探针组件的上表面上的盖32，以封闭空间 30，其中电子元件被布置，以及附接到盖的两个夹持器42。 每个夹持器42具有一端42a，另一端42a具有从大致U形形状的一端到另一端的区域，并且在两端部附接到盖的主体部33。
-
公开(公告)号：US07525329B2
公开(公告)日：2009-04-28
申请号：US11929005
申请日：2007-10-30
IPC分类号： G01R31/02
CPC分类号： G01R31/2889 , G01R1/07378
摘要： A wiring path of a circuit board has a first vertical path portion penetrating the circuit board at its outer edge in its thickness direction and connected to a connector on one surface, a second vertical path portion penetrating the circuit board in its thickness direction and connected to the electric coupler on the other surface, and a lateral path portion connecting both vertical portions, and the second vertical path portion is formed within an arrangement area (S1) of a reinforcing plate. One connecting end portion (electric coupler side) of the wiring path of the circuit board is disposed within the arrangement area (S1) of the reinforcing plate. On the other hand, the other connecting end portion (probe side) of the wiring path of the circuit board is disposed to be dispersed in an arrangement area (S2) wider than the arrangement area (S1) of the reinforcing plate.
摘要翻译： 电路板的布线路径具有第一垂直路径部分，该第一垂直路径部分沿着其厚度方向在其外边缘处穿过电路板，并且连接到一个表面上的连接器，第二垂直路径部分沿厚度方向穿透电路板，并连接到 在另一个表面上的电耦合器和连接两个垂直部分的横向路径部分和第二垂直路径部分形成在加强板的布置区域（S1）内。 电路板的布线路径的一个连接端部（电耦合器侧）设置在加强板的布置区域（S1）内。 另一方面，电路板的布线路径的另一个连接端部（探针侧）被配置为分散在比加强板的布置区域（S1）宽的布置区域（S2）中。
-
-
-
-
-
-
-
-
-
搜索结果
14 条记录 (耗时 0.022 秒)
