公开(公告)号：US20200158754A1

公开(公告)日：2020-05-21

申请号：US16604541

申请日：2018-04-03

申请人： Kabushiki Kaisha Nihon Micronics

发明人： Takayuki HAYASHIZAKI ,  Hisao NARITA

IPC分类号： G01R1/067 ,  G01R1/073

摘要： An electrical connection device includes: a probe (10); and a probe head (20) including a top portion (21) allowing penetration of the probe (10), a bottom portion (23) disposed closer to a distal end portion than the top portion (21) and allowing penetration of the probe (10), and an upper guide portion (24) and a lower guide portion (25), which are disposed between the top portion (21) and the bottom portion (23) and allow penetration of the probe (10), wherein the probe (10) is held in a curved state between the top portion (21) and the bottom portion (23), the probe (10) buckles by contact of the distal end portion with an inspection object (2), and at least a continuous portion of the probe (10), which ranges from a portion where the probe (10) in a buckling state penetrates the bottom portion (23) to a portion where the probe (10) penetrates the lower guide portion (25), is a high-rigidity portion (101) made to have higher rigidity than a buckling portion of the probe (10).

公开(公告)号：US20140009182A1

公开(公告)日：2014-01-09

申请号：US13914952

申请日：2013-06-11

申请人： Kabushiki Kaisha Nihon Micronics

发明人： Mika NASU ,  Akihiro KAROUJI ,  Takayuki HAYASHIZAKI

IPC分类号： G01R31/28 ,  G01R1/067

CPC分类号： G01R31/2889 ,  G01R1/067 ,  G01R1/06727 ,  G01R31/2891

摘要： An electrical contactor has a contact portion that is pressed onto a terminal of an electronic device and is electrically connected. When the dimension of the contact portion is S1, the contact dimension of the contact portion and the terminal of the electronic device is V, the amount of sliding of the contact portion is W, and the additional element including at least positional accuracy of the contact portion is X, the dimension of the contact portion S1 satisfies S1>V+W+X. In a contact method for the electrical contactor, when the sum of a clearance on the front end side in the sliding direction in starting contact and a clearance on the back end side in the sliding direction in ending contact is X3, the crushed area S2 of the terminal is set to satisfy a relationship of S2

摘要翻译： 电接触器具有被按压到电子设备的端子上并被电连接的接触部分。 当接触部分的尺寸为S1时，接触部分和电子设备的端子的接触尺寸为V，接触部分的滑动量为W，并且附加元件至少包括接触位置精度 部分为X，接触部分S1的尺寸满足S1> V + W + X。 在电接触器的接触方法中，当起动接触中的滑动方向上的前端侧的间隙与终止接触时的滑动方向的后端侧的间隙的和为X3时，破碎面积S2 终端被设定为满足S2

公开(公告)号：US20210140999A1

公开(公告)日：2021-05-13

申请号：US17090835

申请日：2020-11-05

申请人： Kabushiki Kaisha Nihon Micronics

发明人： Kenichi TSURUTA ,  Takayuki HAYASHIZAKI ,  Koichiro TOKUMARU ,  Miyuki TOMOOKA

IPC分类号： G01R1/073 ,  H01R12/71 ,  H01R13/03 ,  H05K1/09

摘要： An electrical connection device includes: a wiring board in which lands are arranged on a main surface; and probes. Each of the probes has a distal end portion that contacts an object to be measured and a proximal end portion that contacts the land. A material of a surface film of the proximal end portion, which contacts the land, is a metal material different in composition from a material of the land that contacts the surface film.

公开(公告)号：US20240168056A1

公开(公告)日：2024-05-23

申请号：US18548872

申请日：2022-01-27

申请人： Kabushiki Kaisha Nihon Micronics

发明人： Mika NASU ,  Misaki TOYODA ,  Mizuho KON ,  Kenichi SUTO ,  Takayuki HAYASHIZAKI

IPC分类号： G01R1/067 ,  G01R1/073

CPC分类号： G01R1/06761 ,  G01R1/07314

摘要： A probe is inserted into a through-hole in a guide plate and used for inspecting electrical characteristics of an inspection object, and the probe includes: a columnar conductor; and a plurality of insulating coating materials arranged spaced apart from each other on a surface of the conductor along a central axis direction of the conductor.

公开(公告)号：US20220146553A1

公开(公告)日：2022-05-12

申请号：US17436564

申请日：2020-02-27

申请人： Kabushiki Kaisha Nihon Micronics

发明人： Takayuki HAYASHIZAKI ,  Akihisa AKAHIRA ,  Hisao NARITA ,  Mizuho KON ,  Kenichi SUTO

IPC分类号： G01R1/073 ,  G01R1/067

摘要： An electrical connecting device (1) includes probes (10), and a probe head (20) including a middle guide plate (23) arranged between a top guide plate (21) and a bottom guide plate (22) and closer to the bottom guide plate (22) so as to lead the probes (10) to penetrate therethrough. The top guide plate (21) and the middle guide plate (23) are provided with guide holes through which the probes (10) are inserted at positions shifted between the top guide plate (21) and the middle guide plate (23) so as to lead the probes (10) to be held in a bent state between the top guide plate (21) and the middle guide plate (23). The probes (10) have a structure easier to bend at a region excluding a maximum stress part than at the maximum stress part defined at a position at which a maximum stress is applied to the probes (10) buckled when tip end parts of the probes (10) are brought into contact with an inspection object.

公开(公告)号：US20200124639A1

公开(公告)日：2020-04-23

申请号：US16604546

申请日：2018-04-03

申请人： Kabushiki Kaisha Nihon Micronics

发明人： Takayuki HAYASHIZAKI

IPC分类号： G01R1/073 ,  G01R31/26

摘要： An electrical connection device includes: a probe head (20) including a guide hole (200), in which a shape perpendicular to an extending direction of the guide hole (200) is a shape formed by round-chamfering corner portions of a polygonal shape; and a probe (10) held by the probe head (20) in a state of penetrating the guide hole (200), wherein notches which go along an axial direction of the probe (10) are formed on angle regions of the probe (10), the angle regions facing the corner portions (200C) of the guide hole (200).