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公开(公告)号:US20230125229A1
公开(公告)日:2023-04-27
申请号:US17456839
申请日:2021-11-29
Applicant: KOREA ELECTRONICS TECHNOLOGY INSTITUTE
Inventor: Hyeong Keun KIM , Seul Gi KIM , Hyun Mi KIM , Jin Woo CHO , Ki Hun SEONG
Abstract: A pellicle for extreme ultraviolet (EUV) lithography is based on yttrium carbide and used in a EUV lithography process. The pellicle for EUV lithography includes a pellicle layer that has a core layer containing yttrium carbide. The yttrium carbide is YCX (0.25
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公开(公告)号:US20220334464A1
公开(公告)日:2022-10-20
申请号:US17698455
申请日:2022-03-18
Applicant: KOREA ELECTRONICS TECHNOLOGY INSTITUTE
Inventor: Hyeong Keun KIM , Seul Gi KIM , Hyun Mi KIM , Jin Woo CHO , Ki Hun SEONG
Abstract: This application relates to a pellicle for extreme ultraviolet lithography used in a lithography process using extreme ultraviolet rays. In one aspect, the pellicle includes a pellicle layer formed of an M-α material in which M is combined with α. Here, M is one of Si, Zr, Mo, Ru, Y, W, Ti, Ir, or Nb, and a is at least two of B, N, C, O, or F.
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公开(公告)号:US20220326601A1
公开(公告)日:2022-10-13
申请号:US17698383
申请日:2022-03-18
Applicant: KOREA ELECTRONICS TECHNOLOGY INSTITUTE
Inventor: Hyeong Keun KIM , Seul Gi KIM , Hyun Mi KIM , Jin Woo CHO , Ki Hun SEONG
Abstract: This application relates to a pellicle for extreme ultraviolet lithography based on yttrium (Y) and used in a lithography process using extreme ultraviolet rays. In one aspect, the pellicle includes a pellicle layer including a core layer formed of an yttrium-based material expressed as Y-M (M is one of B, Si, O, or F).
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公开(公告)号:US20220146949A1
公开(公告)日:2022-05-12
申请号:US17454104
申请日:2021-11-09
Applicant: KOREA ELECTRONICS TECHNOLOGY INSTITUTE
Inventor: Hyeong Keun KIM , Hyun Mi KIM , Jin Woo CHO , Seul Gi KIM , Ki Hun SEONG
IPC: G03F7/20
Abstract: A pellicle for extreme ultraviolet lithography has an extreme ultraviolet transmittance of 90% or more and also has thermal stability, mechanical stability, and chemical durability. The pellicle includes a support layer and a pellicle layer. The support layer has an opening formed in a central portion thereof. The pellicle layer is formed on the support layer to cover the opening and includes ZrBx (2
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