公开(公告)号：US20220319731A1

公开(公告)日：2022-10-06

申请号：US17637988

申请日：2020-08-18

申请人： KONINKLIJKE PHILIPS N.V.

发明人： THOMAS KOEHLER ,  ANDRIY YAROSHENKO ,  GEREON VOGTMEIER ,  BERND RUDI DAVID ,  JUERGEN MOHR ,  PAULUS RENÉ MARIA VAN BEERS ,  PASCAL MEYER ,  MICHAEL RICHTER ,  JOACHIM SCHULZ

IPC分类号： G21K1/02 ,  A61B6/00

摘要： In order to improve the mechanical stability of an X-ray grating with top bridges for X-ray dark field imaging and/or X-ray phase contrast imaging, it is proposed to reduce or prevent the undesired high stress on the top bridges by a change in the manufacturing process. Specifically, it is proposed to electroplate the top bridges after the bending. In other words, the electroplating of the top bridges is performed on the bent geometry.