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    Method of calibrating spectral apparatus and method of producing calibrated spectral apparatus
    1.
    发明授权
    Method of calibrating spectral apparatus and method of producing calibrated spectral apparatus 有权

    公开(公告)号：US10768048B2

    公开(公告)日：2020-09-08

    申请号：US15746216

    申请日：2016-07-06

    Applicant: KONICA MINOLTA INC.

    Inventor： Yoshiroh Nagai ,  Toshio Kawano ,  Takashi Kawasaki

    IPC: G01J3/02 ,  G01J3/06 ,  G01J3/36

    Abstract: Spectral apparatus includes sensors that output signals indicating the respective energy amounts of a plurality of wavelength components. For each of the sensors, its reference spectral sensitivity is acquired, and an indicator indicating the reference spectral sensitivity of the sensor, is acquired. The deviation of an indicator indicating the spectral sensitivity of the sensor from the indicator indicating the reference spectral sensitivity of the sensor, is expressed by a linear function of an indicator indicating a mechanical error in the spectral apparatus. The indicator indicating the mechanical error in the spectral apparatus, is acquired to adapt a spectral sensitivity set of sensors to a signal set output by the sensors. For each of the sensors, the deviation of the indicator indicating the spectral sensitivity of the sensor from the indicator indicating the reference spectral sensitivity of the sensor, is acquired, so that the spectral sensitivity of the sensor is acquired.

    Method for measuring spectral radiation characteristics of fluorescence whitened sample, and device for measuring spectral radiation characteristics of fluorescence whitened sample
    3.
    发明授权
    Method for measuring spectral radiation characteristics of fluorescence whitened sample, and device for measuring spectral radiation characteristics of fluorescence whitened sample 有权

    公开(公告)号：US11428631B2

    公开(公告)日：2022-08-30

    申请号：US16492845

    申请日：2018-03-01

    Applicant: KONICA MINOLTA, INC.

    Inventor： Kenji Imura ,  Yoshiroh Nagai

    IPC: G01N21/64 ,  G01N33/34 ,  G01J3/44

    Abstract: An approximation B′f(Id,λ) of a fluorescence spectral emissivity coefficient by a standard illumination light Id is obtained at following steps from spectral power distributions R(Ik,λ) of sample radiation lights radiated from a fluorescence whitened sample when the fluorescence whitened sample is sequentially illuminated with a plurality of excitation lights Ik having different spectral power distributions, and a spectral power distribution Id(λ) of the standard illumination light Id. Spectral power distributions Rf(Ik,λ) of fluorescence are obtained from the spectral power distributions R(Ik,λ) by respective excitation lights Ik (first step). The spectral power distributions Rf(Ik,λ) of fluorescence by the respective excitation lights Ik are linearly combined with a given weighting coefficient Wk, and an approximation R′f(Id,λ) of a spectral power distribution of fluorescence by the standard illumination light Id is obtained by equation (second step: #11). From the approximation R′f(Id,λ) and the spectral power distribution Id(λ) of the standard illumination light Id, the approximation B′f(Id,λ) is obtained by equation (third step: #12).

    Wavelength shift correction system and wavelength shift correction method
    4.
    发明授权
    Wavelength shift correction system and wavelength shift correction method 有权

    公开(公告)号：US10996108B2

    公开(公告)日：2021-05-04

    申请号：US16641010

    申请日：2018-05-29

    Applicant: KONICA MINOLTA, INC.

    Inventor： Yoshiroh Nagai

    IPC: G01J3/02 ,  G01J3/10 ,  G01J3/06

    Abstract: A system and method include a wavelength shift correction light source emitting wavelength shift correction emission-line light and a spectrometer including: a spectroscopic unit receiving with photoelectric conversion elements rays of dispersed spectral light obtained by dispersing incident light based on wavelength, and outputs electrical signals corresponding to light intensities of the rays of dispersed spectral light; and a unit that measures temperature of the spectroscopic unit. When the wavelength shift correction emission-line light is measured as the incident light with the spectrometer, this system and method determine wavelength shift correction time emission-line wavelength corresponding to wavelength shift correction emission-line light, based on electrical signals from photoelectric conversion elements receiving wavelength shift correction emission-line light, and the measured temperature. The system and method determine wavelength variation from the difference between determined wavelength shift correction time emission-line wavelength and known emission-line wavelength of the wavelength shift correction emission-line light.

    COLOUR MEASUREMENT DEVICE AND COLOUR MEASUREMENT METHOD
    6.
    发明申请
    COLOUR MEASUREMENT DEVICE AND COLOUR MEASUREMENT METHOD 有权
    颜色测量设备和颜色测量方法

    公开(公告)号：US20170078505A1

    公开(公告)日：2017-03-16

    申请号：US15309105

    申请日：2015-04-23

    Applicant: Konica Minolta, Inc.

    Inventor： Yasushi Goto ,  Yoshiroh Nagai

    IPC: H04N1/00 ,  G01J3/52

    CPC classification number: H04N1/00702 ,  G01J3/52 ,  G01J3/524 ,  H04N1/00015 ,  H04N1/00023 ,  H04N1/00034 ,  H04N1/00045 ,  H04N1/00087 ,  H04N1/00734 ,  H04N1/00748 ,  H04N1/00779 ,  H04N2201/0082

    Abstract: A color measurement device acquires an image of a relative position calibration chart. The relative position calibration chart includes a calibration figure having a given calibration feature that has a position that is detectable along at least one of a first and a second direction. A color measurement of the relative position calibration chart is performed. Relative position relationship-related information is derived based on the calibration feature in the image of the relative position calibration chart and the calibration feature in the color measurement of the relative position calibration chart. A color of each patch of a number of patches of a color chart is measured at a position corresponding to one of the patches while correcting the position of the patch based on the position relationship-related information.

    Abstract translation: 颜色测量装置获取相对位置校准图的图像。 相对位置校准图包括具有给定校准特征的校准图，其具有沿着第一和第二方向中的至少一个可检测的位置。 执行相对位置校准图的颜色测量。 相对位置关系相关信息基于相对位置校准图的图像中的校准特征和相对位置校准图的颜色测量中的校准特征得出。 基于位置关系相关信息来校正补丁的位置，在与一个补丁相对应的位置处测量彩色图表的多个补丁的每个补丁的颜色。

    Spectrocolorimetric device and conversation rule setting method
    7.
    发明授权
    Spectrocolorimetric device and conversation rule setting method 有权

    公开(公告)号：US10514300B2

    公开(公告)日：2019-12-24

    申请号：US15571441

    申请日：2016-04-14

    Applicant: KONICA MINOLTA, INC.

    Inventor： Yoshiroh Nagai

    IPC: G01J3/50 ,  G01J3/02 ,  G01J3/46 ,  G01J3/52

    Abstract: Spectrocolorimetric device includes a light source, a light-receiving unit, a calculation unit, a storage unit, an acquisition unit, and a conversion unit. The light-receiving unit spectroscopically disperses reflected light generated on a surface and measures a spectroscopic spectrum relating to the reflected light. The calculation unit calculates a first spectral reflectance from the spectroscopic spectrum. The storage unit stores relationship information indicating a relationship between a reflectance and a reflectance difference for each wavelength. The acquisition unit acquires reflectance difference for each wavelength between the first spectral reflectance acquired using the spectrocolorimetric device and a second spectral reflectance acquired using a destination-of-conversion spectrocolorimetric device on the basis of the first spectral reflectance and the relationship information. The conversion unit converts the first spectral reflectance into the second spectral reflectance by adding or subtracting the reflectance difference for each wavelength acquired by the acquisition unit to or from the first spectral reflectance.

    Method of calibrating spectral apparatus and method of producing calibrated spectral apparatus
    9.
    发明授权
    Method of calibrating spectral apparatus and method of producing calibrated spectral apparatus 有权

    公开(公告)号：US11307093B2

    公开(公告)日：2022-04-19

    申请号：US16986884

    申请日：2020-08-06

    Applicant: KONICA MINOLTA INC.

    Inventor： Yoshiroh Nagai ,  Toshio Kawano ,  Takashi Kawasaki

    IPC: G01J3/02 ,  G01J3/06 ,  G01J3/36

    Abstract: Creating a model calibrating spectral apparatus having an optical system that converts light to be measured into a spectrum, and a light-receiving sensor including a plurality of sensors that outputs signals, the sensors include sensors that output signals indicating respective energy amounts of a plurality of wavelength components. The model shows where a linear function of an indicator indicating a mechanical error in the spectral apparatus, expresses deviation of an indicator indicating spectral sensitivity of the sensor from the indicator indicating the reference spectral sensitivity of the sensor. The method comprises: a) acquiring reference spectral sensitivity; b) acquiring an indicator indicating the reference spectral sensitivity of the sensor acquired at a); and c) creating the model where the linear function of the mechanical error indicator expresses deviation of the spectral sensitivity indicator from the indicator indicating the reference spectral sensitivity of the sensor, acquired at b).

    Wavelength shift correction system and wavelength shift correction method
    10.
    发明授权
    Wavelength shift correction system and wavelength shift correction method 有权

    公开(公告)号：US11231321B2

    公开(公告)日：2022-01-25

    申请号：US16640941

    申请日：2018-05-29

    Applicant: KONICA MINOLTA, INC.

    Inventor： Yoshiroh Nagai

    IPC: G01J3/28

    Abstract: A wavelength shift correction system and method includes a wavelength shift correction light source that emits wavelength shift correction light including a plurality of rays of wavelength shift correction emission-line light; and a spectrometer including a spectroscopic unit that receives the respective rays of dispersed spectral light obtained by dispersing incident light in accordance with wavelength with a plurality of photoelectric converters in the dispersion direction, and outputs electrical signals corresponding to the light intensities of the rays of dispersed spectral light. When the wavelength shift correction light is measured as the incident light with the spectrometer to be subjected to wavelength shift correction, a wavelength variation is determined on the basis of the respective electrical signals output from a plurality of specific photoelectric conversion elements that receive the plurality of rays of wavelength shift correction emission-line light in the plurality of photoelectric conversion elements.

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