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公开(公告)号:US11243550B2
公开(公告)日:2022-02-08
申请号:US16887668
申请日:2020-05-29
Applicant: Juniper Networks, Inc.
Inventor: Chris Barnard , Steven William Keck , Crispin Cruz Mapagay , George R. Sosnowski , Mark Stenholm
Abstract: An optical-electrical device can implement a feedback-based control loop for temperature of the device during component calibration. The optical-electrical device can implement compressed air to vary the device temperature during calibration. Additionally, non-active components of the device can be provided current to vary the temperature of the device in concert with the provided compressed air. Additional calibration temperatures can be implemented by activating and deactivating additional non-active components in the device, such as light sources, optical amplifiers, and modulators.
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公开(公告)号:US20220107659A1
公开(公告)日:2022-04-07
申请号:US17554387
申请日:2021-12-17
Applicant: Juniper Networks, Inc.
Inventor: Chris Barnard , Steven William Keck , Crispin Cruz Mapagay , George R. Sosnowski , Mark Stenholm
Abstract: An optical-electrical device can implement a feedback-based control loop for temperature of the device during component calibration. The optical-electrical device can implement compressed air to vary the device temperature during calibration. Additionally, non-active components of the device can be provided current to vary the temperature of the device in concert with the provided compressed air. Additional calibration temperatures can be implemented by activating and deactivating additional non-active components in the device, such as light sources, optical amplifiers, and modulators.
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公开(公告)号:US20210373585A1
公开(公告)日:2021-12-02
申请号:US16887668
申请日:2020-05-29
Applicant: Juniper Networks, Inc.
Inventor: Chris Barnard , Steven William Keck , Crispin Cruz Mapagay , George R. Sosnowski , Mark Stenholm
Abstract: An optical-electrical device can implement a feedback-based control loop for temperature of the device during component calibration. The optical-electrical device can implement compressed air to vary the device temperature during calibration. Additionally, non-active components of the device can be provided current to vary the temperature of the device in concert with the provided compressed air. Additional calibration temperatures can be implemented by activating and deactivating additional non-active components in the device, such as light sources, optical amplifiers, and modulators.
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公开(公告)号:US20220034963A1
公开(公告)日:2022-02-03
申请号:US16943353
申请日:2020-07-30
Applicant: Juniper Networks, Inc.
Inventor: Steven William Keck , Crispin Cruz Mapagay , Mark Stenholm
IPC: G01R31/317 , G02B6/42 , G01N21/31
Abstract: A hybrid optical-electrical automated testing equipment (ATE) system can implement a workpress assembly that can interface with a device under test (DUT) and a load board that holds the DUT during testing, analysis, and calibration. A test hand can actuate to position the DUT on a socket and align one or more alignment features. The workpress assembly can include two optical interfaces that are optically coupled such that light can be provided to a side of the DUT that is facing away from the load board, thereby enabling the ATE system to perform simultaneous optical and electrical testing of the DUT.
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