DC-DC converter efficiency improvement and area reduction using a novel switching technique
    1.
    发明授权
    DC-DC converter efficiency improvement and area reduction using a novel switching technique 有权
    DC-DC转换器的效率提高和使用新颖的切换技术的面积减少

    公开(公告)号:US09312758B2

    公开(公告)日:2016-04-12

    申请号:US12661515

    申请日:2010-03-18

    CPC classification number: H02M3/156 H02M3/07

    Abstract: A control logic of a switched DC-to-DC converter allows continuous switching to bring the DC-to-DC converter to a final output value during a startup phase, it allows skipping of clock switching pulses if they are not needed and allows burst mode of switching pulses dependent on a load applied to the output voltage of the DC-to-DC converter. No digital or analog regulator is required for the control logic.

    Abstract translation: 开关DC-DC转换器的控制逻辑允许连续切换,使DC-DC转换器在启动阶段达到最终的输出值,如果不需要时可以跳过时钟切换脉冲,并允许突发模式 取决于施加到DC-DC转换器的输出电压的负载的开关脉冲。 控制逻辑不需要数字或模拟调节器。

    DC-DC converter efficiency improvement and area reduction using a novel switching technique
    2.
    发明申请
    DC-DC converter efficiency improvement and area reduction using a novel switching technique 有权
    DC-DC转换器的效率提高和使用新颖的切换技术的面积减少

    公开(公告)号:US20110204861A1

    公开(公告)日:2011-08-25

    申请号:US12661515

    申请日:2010-03-18

    CPC classification number: H02M3/156 H02M3/07

    Abstract: Systems and methods to achieve a switched DC-to-DC converter having an improved efficiency have been disclosed. A control logic allows continuous switching to bring the DC-to-DC converter to a final output value during a startup phase, it allows skipping of clock switching pulses if they are not needed and allows burst mode of switching pulses dependent on a load applied to the output voltage of the DC-to-DC converter. No digital or analog regulator is required for the control logic.

    Abstract translation: 已经公开了实现具有改进的效率的开关式DC-DC转换器的系统和方法。 控制逻辑允许连续切换在启动阶段使DC-DC转换器达到最终的输出值,如果不需要时可以跳过时钟切换脉冲,并允许脉冲串模式的开关脉冲取决于施加到 DC-DC转换器的输出电压。 控制逻辑不需要数字或模拟调节器。

    On-chip test technique for low drop-out regulators
    3.
    发明授权
    On-chip test technique for low drop-out regulators 有权
    用于低压差稳压器的片上测试技术

    公开(公告)号:US09151804B2

    公开(公告)日:2015-10-06

    申请号:US13443919

    申请日:2012-04-11

    CPC classification number: G01R31/40 G01R31/2834 G01R31/31721 G05F1/56

    Abstract: A circuit and method is described for automatically testing multiple LDO regulator circuits on an integrated circuit chip independent of an ATE. Each LDO regulator is tested for voltage at a specified current output capability, wherein the output driver transistor is formed by at least two pass transistors, which are each tested for voltage output at a particular current capability. The test results are delivered back to the ATE and for a failed test, the gate voltage of the pass device can be observed through an analog multiplexer to enable debug.

    Abstract translation: 描述了一种用于在独立于ATE的集成电路芯片上自动测试多个LDO稳压器电路的电路和方法。 每个LDO调节器以指定的电流输出能力测试电压,其中输出驱动器晶体管由至少两个传输晶体管形成,每个晶体管都以特定电流能力测试电压输出。 测试结果被传送回ATE,对于失败的测试,可以通过模拟多路复用器观察通过器件的栅极电压,以启用调试。

    On-Chip Test Technique for Low Drop-Out Regulators
    4.
    发明申请
    On-Chip Test Technique for Low Drop-Out Regulators 有权
    低压降稳压器片上测试技术

    公开(公告)号:US20130265060A1

    公开(公告)日:2013-10-10

    申请号:US13443919

    申请日:2012-04-11

    CPC classification number: G01R31/40 G01R31/2834 G01R31/31721 G05F1/56

    Abstract: A circuit and method is described for automatically testing multiple LDO regulator circuits on an integrated circuit chip independent of an ATE. Each LDO regulator is tested for voltage at a specified current output capability, wherein the output driver transistor is formed by at least two pass transistors, which are each tested for voltage output at a particular current capability. The test results are delivered back to the ATE and for a failed test, the gate voltage of the pass device can be observed through an analog multiplexer to enable debug.

    Abstract translation: 描述了一种用于在独立于ATE的集成电路芯片上自动测试多个LDO稳压器电路的电路和方法。 每个LDO调节器以指定的电流输出能力测试电压,其中输出驱动器晶体管由至少两个传输晶体管形成,每个晶体管都以特定电流能力测试电压输出。 测试结果被传送回ATE,对于失败的测试,可以通过模拟多路复用器观察通过器件的栅极电压,以启用调试。

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