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公开(公告)号：US20070158768A1
公开(公告)日：2007-07-12
申请号：US11326944
申请日：2006-01-06
Applicant: Jorg Pilchowski , George Skidmore
Inventor： Jorg Pilchowski , George Skidmore
CPC classification number: H01H1/027 , B82Y10/00 , H01H1/0094 , H01H35/14 , H01H37/5418 , H01H2037/008
Abstract: An apparatus and method for a micromachined mechanical switch device having first and second cooperating electrical switch contacts formed by respective first and second patterns of robust carbon nanotube thin film structures for forming intermittent electrical contact between the first and second conductors in response to the applied force urging the first and second cooperating patterns of carbon nanotube thin film structures together into momentary or substantially permanent physical contact.
Abstract translation: 一种用于微加工机械开关装置的装置和方法，具有由相应的第一和第二图形的坚固的碳纳米管薄膜结构形成的第一和第二协作电开关触点，用于响应于所施加的力促进在第一和第二导体之间形成间歇性电接触 碳纳米管薄膜结构的第一和第二配合图案一起变成瞬时或基本上永久的物理接触。
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公开(公告)号：US20080092803A1
公开(公告)日：2008-04-24
申请号：US11955845
申请日：2007-12-13
Applicant: John Randall , Jingping Peng , Jun-Fu Liu , George Skidmore , Christof Baur , Richard Stallcup , Robert Folaron
Inventor： John Randall , Jingping Peng , Jun-Fu Liu , George Skidmore , Christof Baur , Richard Stallcup , Robert Folaron
Abstract: A patterned layer is formed by removing nanoscale passivating particle from a first plurality of nanoscale structural particles or by adding nanoscale passivating particles to the first plurality of nanoscale structural particles. Each of a second plurality of nanoscale structural particles is deposited on each of corresponding ones of the first plurality of nanoscale structural particles that is not passivated by one of the plurality of nanoscale passivating particles.
Abstract translation: 通过从第一多个纳米尺度结构颗粒中去除纳米尺度钝化颗粒或通过将纳米尺度钝化颗粒添加到第一多个纳米级结构颗粒而形成图案层。 第二多个纳米尺度结构颗粒中的每一个沉积在第一多个纳米尺度结构颗粒中的相应的一个纳米级结构颗粒中，其不被多个纳米级钝化颗粒之一钝化。
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Patent Agency Ranking
3.发明申请Method, system and device for microscopic examination employing fib-prepared sample grasping element 有权使用纤维制备的样品把持元件进行显微镜检查的方法，系统和装置公开(公告)号：US20050178980A1
公开(公告)日：2005-08-18
申请号：US10948385
申请日：2004-09-23
Applicant: George Skidmore , Matthew Ellis , Aaron Geisberger , Kenneth Bray , Kimberly Tuck , Robert Folaron
Inventor： George Skidmore , Matthew Ellis , Aaron Geisberger , Kenneth Bray , Kimberly Tuck , Robert Folaron
CPC classification number: H01J37/185 , G01N1/28 , G01N1/286 , G01N1/32 , G01N2001/2886 , G02B21/32 , H01J37/20 , H01J37/3056 , H01J2237/2007 , H01J2237/204 , H01J2237/31745 , H01J2237/31749
Abstract: A method including, in one embodiment, severing a sample at least partially from a substrate by cutting the substrate with a focused ion beam (FIB), capturing the substrate sample by activating a grasping element, and separating the captured sample from the substrate. The captured sample may be separated from the substrate and transported to an electron microscope for examination.
Abstract translation: 一种方法包括在一个实施方案中，通过用聚焦离子束（FIB）切割衬底，至少部分地从衬底切割样品，通过激活抓握元件捕获衬底样品，以及将捕获的样品与衬底分离。 捕获的样品可以与基底分离并输送到电子显微镜进行检查。
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4.发明授权Method, system and device for microscopic examination employing fib-prepared sample grasping element 有权使用纤维制备的样品把持元件进行显微镜检查的方法，系统和装置公开(公告)号：US07227140B2
公开(公告)日：2007-06-05
申请号：US10948385
申请日：2004-09-23
Applicant: George Skidmore , Matthew D. Ellis , Aaron Geisberger , Kenneth Bray , Kimberly Tuck , Robert Folaron
Inventor： George Skidmore , Matthew D. Ellis , Aaron Geisberger , Kenneth Bray , Kimberly Tuck , Robert Folaron
IPC: G21G5/00
CPC classification number: H01J37/185 , G01N1/28 , G01N1/286 , G01N1/32 , G01N2001/2886 , G02B21/32 , H01J37/20 , H01J37/3056 , H01J2237/2007 , H01J2237/204 , H01J2237/31745 , H01J2237/31749
Abstract: A method including, in one embodiment, severing a sample at least partially from a substrate by cutting the substrate with a focused ion beam (FIB), capturing the substrate sample by activating a grasping element, and separating the captured sample from the substrate. The captured sample may be separated from the substrate and transported to an electron microscope for examination.
Abstract translation: 一种方法包括在一个实施方案中，通过用聚焦离子束（FIB）切割衬底，至少部分地从衬底切割样品，通过激活抓握元件捕获衬底样品，以及将捕获的样品与衬底分离。 捕获的样品可以与基底分离并输送到电子显微镜进行检查。
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公开(公告)号：US06923669B1
公开(公告)日：2005-08-02
申请号：US10778460
申请日：2004-02-13
Applicant: Kenneth Tsui , Aaron Geisberger , George Skidmore
Inventor： Kenneth Tsui , Aaron Geisberger , George Skidmore
CPC classification number: B81C99/002 , B81B2201/13 , B81C3/008
Abstract: A MEMS microconnector including a compliant handle and a deflectable connection member. The compliant handle is configured to frictionally engage a manipulation probe. The deflectable connection member includes a first end coupled to the handle and a second end configured to deflect and thereby engage a receptacle in response to disengagement of the manipulation probe from the handle.
Abstract translation: 一种MEMS微连接器，其包括柔性手柄和可偏转连接构件。 顺应手柄被配置为摩擦地接合操纵探针。 可偏转连接构件包括联接到手柄的第一端和构造成响应于操纵探针与手柄的分离而偏转并因此接合插座的第二端。
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公开(公告)号：US20050223968A1
公开(公告)日：2005-10-13
申请号：US11089814
申请日：2005-03-25
Applicant: John Randall , Jingping Peng , Jun-Fu Liu , George Skidmore , Christof Baur , Richard Stallcup , Robert Folaron
Inventor： John Randall , Jingping Peng , Jun-Fu Liu , George Skidmore , Christof Baur , Richard Stallcup , Robert Folaron
Abstract: A patterned layer is formed by removing nanoscale passivating particle from a first plurality of nanoscale structural particles or by adding nanoscale passivating particles to the first plurality of nanoscale structural particles. Each of a second plurality of nanoscale structural particles is deposited on each of corresponding ones of the first plurality of nanoscale structural particles that is not passivated by one of the plurality of nanoscale passivating particles.
Abstract translation: 通过从第一多个纳米尺度结构颗粒中去除纳米尺度钝化颗粒或通过将纳米尺度钝化颗粒添加到第一多个纳米尺度结构颗粒中而形成图案层。 第二多个纳米尺度结构颗粒中的每一个沉积在第一多个纳米尺度结构颗粒中的相应的一个纳米级结构颗粒中，其不被多个纳米级钝化颗粒之一钝化。
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公开(公告)号：US20050181658A1
公开(公告)日：2005-08-18
申请号：US10778460
申请日：2004-02-13
Applicant: Kenneth Tsui , Aaron Geisberger , George Skidmore
Inventor： Kenneth Tsui , Aaron Geisberger , George Skidmore
CPC classification number: B81C99/002 , B81B2201/13 , B81C3/008
Abstract: A MEMS microconnector including a compliant handle and a deflectable connection member. The compliant handle is configured to frictionally engage a manipulation probe. The deflectable connection member includes a first end coupled to the handle and a second end configured to deflect and thereby engage a receptacle in response to disengagement of the manipulation probe from the handle.
Abstract translation: 一种MEMS微连接器，其包括柔性手柄和可偏转连接构件。 顺应手柄被配置为摩擦地接合操纵探针。 可偏转连接构件包括联接到手柄的第一端和构造成响应于操纵探针与手柄的分离而偏转并因此接合插座的第二端。
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