公开(公告)号：US08964902B2

公开(公告)日：2015-02-24

申请号：US13882761

申请日：2011-11-14

申请人： Jiangshan Chen ,  Zhenguo Ma ,  Liyong Yin

发明人： Jiangshan Chen ,  Zhenguo Ma ,  Liyong Yin

IPC分类号： H04L25/06 ,  H04L27/22

CPC分类号： H04L25/061 ,  H04L27/22

摘要： The present invention provides a method and an apparatus for eliminating direct current offset. The method comprises the steps of: calculating Euclidean distances between every two demodulation symbols of a plurality of demodulation symbols based on Quadrature Phase Shift Keying (QPSK) modulation; determining four sets from the plurality of demodulation symbols in accordance with the Euclidean distances between the demodulation symbols, each set corresponding to a modulation direction for the QPSK modulation; performing Euclidean distance weighted summation on the determined four sets respectively, and selecting a demodulation symbol with the minimum weighted summation value from each set as a rough estimation point for the QPSK modulation, so as to obtain four rough estimation points; re-determining four sets from the plurality of demodulation symbols in accordance with the Euclidean distances between the demodulation symbols and the rough estimation points; performing Euclidean distance weighted summation on the re-determined four sets respectively, and selecting a demodulation symbol with the minimum weighted summation value from each set as a precise estimation point; and performing direct current offset calculation and compensation in accordance with the precise estimation points. The present invention can improve the demodulation performance of a system.

摘要翻译： 本发明提供一种消除直流偏移的方法和装置。 该方法包括以下步骤：基于正交相移键控（QPSK）调制来计算多个解调符号的每两个解调符号之间的欧几里德距离; 根据与用于QPSK调制的调制方向相对应的每个解调符号之间的欧几里德距离，从多个解调符号确定四组; 对所确定的四组进行欧几里德距离加权求和，并从每组中选择具有最小加权求和值的解调符号作为QPSK调制的粗略估计点，以获得四个粗略估计点; 根据解调符号与粗估计点之间的欧氏距离重新确定来自多个解调符号的四组; 对重新确定的四组进行欧几里德距离加权求和，并从每组中选择具有最小加权求和值的解调符号作为精确估计点; 并根据精确的估计点进行直流偏移计算和补偿。 本发明可以提高系统的解调性能。

公开(公告)号：US20130294545A1

公开(公告)日：2013-11-07

申请号：US13882761

申请日：2011-11-14

申请人： Jiangshan Chen ,  Zhenguo Ma ,  Liyong Yin

发明人： Jiangshan Chen ,  Zhenguo Ma ,  Liyong Yin

IPC分类号： H04L25/06

CPC分类号： H04L25/061 ,  H04L27/22

摘要： The present invention provides a method and an apparatus for eliminating direct current offset. The method comprises the steps of: calculating Euclidean distances between every two demodulation symbols of a plurality of demodulation symbols based on Quadrature Phase Shift Keying (QPSK) modulation; determining four sets from the plurality of demodulation symbols in accordance with the Euclidean distances between the demodulation symbols, each set corresponding to a modulation direction for the QPSK modulation; performing Euclidean distance weighted summation on the determined four sets respectively, and selecting a demodulation symbol with the minimum weighted summation value from each set as a rough estimation point for the QPSK modulation, so as to obtain four rough estimation points; re-determining four sets from the plurality of demodulation symbols in accordance with the Euclidean distances between the demodulation symbols and the rough estimation points; performing Euclidean distance weighted summation on the re-determined four sets respectively, and selecting a demodulation symbol with the minimum weighted summation value from each set as a precise estimation point; and performing direct current offset calculation and compensation in accordance with the precise estimation points. The present invention can improve the demodulation performance of a system.

摘要翻译： 本发明提供一种消除直流偏移的方法和装置。 该方法包括以下步骤：基于正交相移键控（QPSK）调制来计算多个解调符号的每两个解调符号之间的欧几里德距离; 根据与用于QPSK调制的调制方向相对应的每个解调符号之间的欧几里德距离，从多个解调符号确定四组; 对所确定的四组进行欧几里德距离加权求和，并从每组中选择具有最小加权求和值的解调符号作为QPSK调制的粗略估计点，以获得四个粗略估计点; 根据解调符号与粗估计点之间的欧氏距离重新确定来自多个解调符号的四组; 对重新确定的四组进行欧几里德距离加权求和，并从每组中选择具有最小加权求和值的解调符号作为精确估计点; 并根据精确的估计点进行直流偏移计算和补偿。 本发明可以提高系统的解调性能。

公开(公告)号：US07578890B2

公开(公告)日：2009-08-25

申请号：US11753219

申请日：2007-05-24

申请人： Yuling Liu ,  Xinhuan Niu ,  Shengli Wang ,  Juan Wang ,  Weiwei Li ,  Zhenguo Ma

发明人： Yuling Liu ,  Xinhuan Niu ,  Shengli Wang ,  Juan Wang ,  Weiwei Li ,  Zhenguo Ma

IPC分类号： B08B3/00 ,  B08B3/12 ,  C25F1/00 ,  C25F3/30

CPC分类号： H01L21/02052 ,  C11D1/72 ,  C11D3/30 ,  C11D11/0047 ,  C11D11/007

摘要： Taught is a method of removal surface contaminants, including organic contaminants, metal ions and solid particles, from silicon wafer surface comprising the following steps: (a) submerging the silicon wafer surface in an aqueous cleaning agent solution through which current is passed using a boron-doped diamond film as an electrode; (b) submerging the silicon wafer surface in an aqueous cleaning agent solution; subjecting the silicon wafer to ultrasound waves; and, optionally, heating the solution; (c) submerging the silicon wafer surface in water through which current is passed using a boron-doped diamond film as an electrode; (d) submerging the silicon wafer surface in water with ultrasound and heating; (e) repeating step (d); and (f) spraying the silicon surface with water. The results obtained using the method according to this invention are far superior to those obtained with conventional methods. The technology is simple, convenient to operate, and environmentally friendly.

摘要翻译： 教授是从硅晶片表面去除表面污染物（包括有机污染物，金属离子和固体颗粒）的方法，包括以下步骤：（a）将硅晶片表面浸入通过其中流过电流的水性清洁剂溶液中 掺杂金刚石膜作为电极; （b）将硅晶片表面浸没在水性清洁剂溶液中; 对硅晶片进行超声波; 和任选地加热溶液; （c）使用掺杂硼的金刚石膜作为电极将硅晶片表面浸入通过电流的水中; （d）用超声波和加热将硅晶片表面浸入水中; （e）重复步骤（d）; 和（f）用水喷涂硅表面。 使用根据本发明的方法获得的结果远远优于用常规方法获得的结果。 技术简单，操作方便，环保。