公开(公告)号：US20150160144A1

公开(公告)日：2015-06-11

申请号：US14626415

申请日：2015-02-19

申请人： Jentek Sensors, Inc.

发明人： Neil J. Goldfine ,  Vladimir A. Zilberstein ,  Ian C. Shay ,  Christopher A. Craven ,  David C. Grundy ,  Volker Weiss ,  Andrew P. Washabaugh

IPC分类号： G01N27/02 ,  G01N27/60 ,  G01N27/72 ,  G01N25/00 ,  G01N19/00

CPC分类号： G01N27/02 ,  G01N19/00 ,  G01N25/00 ,  G01N27/60 ,  G01N27/72 ,  G05D23/1931 ,  G05D23/22 ,  G05D23/24 ,  G05D23/26

摘要： The condition of internal or hidden material layers or interfaces is monitored and used for control of a process that changes a condition of a material system. The material system has multiple component materials, such as layers or embedded constituents, or can be represented with multiple layers to model spatial distributions in the material properties. The material condition changes as a result of a process performed on the material, such as by cold working, or from functional operation. Sensors placed proximate to the test material surface or embedded between material layers are used to monitor a material property using magnetic, electric, or thermal interrogation fields. The sensor responses are converted into states of the material condition, such as temperature or residual stress, typically with a precomputed database of sensor responses. The sensor responses can also be used to determine properties of the test material, such as electrical conductivity or magnetic permeability, prior to conversion to the material state. The states are used to support control decisions that control the process or operation causing the material condition to change.

摘要翻译： 监控内部或隐藏的材料层或界面的状况，并用于控制改变材料系统状态的过程。 材料系统具有多种组分材料，例如层或嵌入组分，或者可以用多层来表示材料性质中的空间分布。 材料状态由于通过冷加工或功能操作在材料上进行的过程而改变。 使用放置在测试材料表面附近或嵌入材料层之间的传感器用于使用磁，电或热询问场监测材料特性。 传感器响应被转换为材料状态的状态，例如温度或残余应力，通常具有传感器响应的预计算数据库。 在转换到材料状态之前，传感器响应也可用于确定测试材料的性质，例如导电性或磁导率。 这些状态用于支持控制过程或操作的控制决策，从而导致材料状况发生变化。