公开(公告)号：US12203835B2

公开(公告)日：2025-01-21

申请号：US17601617

申请日：2020-04-03

Applicant: JFE STEEL CORPORATION

Inventor： Toshiki Tsuboi ,  Naoshi Yamahira

IPC: G01N15/0205 ,  C21B5/00 ,  C21B7/24 ,  F27B1/28 ,  G01N15/02 ,  G01N15/075 ,  G01N33/00 ,  G01N33/24 ,  F27D19/00 ,  F27D21/02 ,  G01N15/00 ,  G01N21/17

Abstract: A fine ratio measuring method and apparatus. The fine ratio measuring method includes a step S1 of measuring a distance between a distance measuring device and lumps of material, a step S2 of calculating a feature quantity from distance data obtained in the step S1, and a step S3 of converting the feature quantity calculated in step S2 to a fine ratio. The feature quantity calculated in step S2 represents distance variation calculated from the distance data obtained in the step S1. A higher fine ratio in lumps of material means greater microscopic distance variation caused by microscopic irregularities in the surface of the lumps of material in the height direction within a three-dimensional shape. Therefore, by using the distance variation as the feature quantity, the fine ratio in the lumps of material can be measured in real time with high accuracy.

公开(公告)号：US20210102885A1

公开(公告)日：2021-04-08

申请号：US16498110

申请日：2018-03-30

Applicant: JFE Steel Corporation

Inventor： Naoshi Yamahira ,  Takahiro Nishino ,  Takehide Hirata ,  Kazuro Tsuda ,  Toshiki Tsuboi

IPC: G01N15/08 ,  G01N15/14

Abstract: Provided are a raw material particle size distribution measuring apparatus and a particle size distribution measuring method. Also provided is a porosity measuring apparatus. The raw material particle size distribution measuring apparatus includes: a coarse particle measuring device that acquires information indicating the particle size distribution of the coarse particles; a fine particle measuring device that acquires information indicating the particle size distribution of the fine particles; and an arithmetic device that computes the particle size distribution of the coarse particles using the information indicating the particle size distribution of the coarse particles, computes the particle size distribution of the fine particles using the information indicating the particle size distribution of the fine particles, and computes an overall particle size distribution of the raw material using the particle size distribution of the coarse particles and the particle size distribution of the fine particles.

公开(公告)号：US20210048386A1

公开(公告)日：2021-02-18

申请号：US17043851

申请日：2019-03-26

Applicant: JFE Steel Corporation

Inventor： Naoshi Yamahira ,  Toshiki Tsuboi

IPC: G01N21/31 ,  G01N21/27

Abstract: A fine ratio measuring device that measures a ratio of fines adhering to the surface of a material in the form of lumps, the fine ratio measuring device includes: an illumination unit that illuminates the material in the form of lumps; a spectrometer that performs spectral analysis on light reflected from the material in the form of lumps to measure spectral reflectance; and an arithmetic device that extracts at least one feature quantity from the spectral reflectance measured by the spectrometer and computes the fine ratio from the extracted at least one feature quantity.

公开(公告)号：US11555781B2

公开(公告)日：2023-01-17

申请号：US17043851

申请日：2019-03-26

Applicant: JFE Steel Corporation

Inventor： Naoshi Yamahira ,  Toshiki Tsuboi

IPC: G01N21/31 ,  G01N21/27 ,  G01N21/84 ,  G01N21/85

Abstract: A fine ratio measuring device that measures a ratio of fines adhering to the surface of a material in the form of lumps, the fine ratio measuring device includes: an illumination unit that illuminates the material in the form of lumps; a spectrometer that performs spectral analysis on light reflected from the material in the form of lumps to measure spectral reflectance; and an arithmetic device that extracts at least one feature quantity from the spectral reflectance measured by the spectrometer and computes the fine ratio from the extracted at least one feature quantity.

公开(公告)号：US11187637B2

公开(公告)日：2021-11-30

申请号：US17042044

申请日：2019-03-19

Applicant: JFE STEEL CORPORATION

Inventor： Naoshi Yamahira ,  Toshiki Tsuboi

IPC: G01N15/02 ,  G01N21/25 ,  G01N21/3563 ,  G01N21/55 ,  G01N21/27

Abstract: A particle size distribution measurement apparatus includes a coarse grain measurement device that acquires information indicating distribution of coarse grains, an adherent powder measurement device that acquires information indicating distribution of adherent powder, and a computation device that calculates distribution of a raw material. The computation device includes a coarse grain particle size distribution calculation unit configured to calculate the distribution of the coarse grains on the basis of the information acquired by the coarse grain measurement device, an adherent powder particle size distribution calculation unit configured to calculate the particle size distribution of the adherent powder on the basis of the information acquired by the adherent powder measurement device, and a raw material particle size distribution calculation unit configured to calculate the particle size distribution of the raw material on the basis of the distribution calculated by the coarse grain and adherent powder particle size distribution calculation units.