Abstract:
An apparatus includes a coreless substrate with a through-silicon via (TSV) embedded die that is integral to the coreless substrate. The apparatus includes a subsequent die that is coupled to the TSV die and that is disposed above the coreless substrate.
Abstract:
One embodiment provides an apparatus comprising a circuit board; an active interposer coupled with the circuit board via a debug package, and a graphics processor die coupled with the active interposer via the debug package. The graphics processor die includes graphics processor resources configured to execute instructions for a multi-die system on chip (SoC) device and excludes functionality that is implemented in a separate due of the multi-die SoC. The apparatus includes a field-programmable gate array (FPGA) including hardware logic that is configurable to emulate functionality provided by the separate die of the multi-die SoC device, which enables silicon validation of the graphics processor die separately from other dies of the multi-die SoC.