公开(公告)号：US20210103014A1

公开(公告)日：2021-04-08

申请号：US16590985

申请日：2019-10-02

Applicant: Infineon Technologies AG

Inventor： Christoph SCHROERS ,  Manfred STEINER ,  Armin WINKLER

IPC: G01R33/09 ,  G01R33/07 ,  G01R33/028

Abstract: A sensor die may include a set of sensing elements and a test structure associated with determining a magnetic sensitivity of the set of sensing elements. The test structure includes a first test sensing element sensitive in a direction in a plane defined by a surface of the sensor die, a second test sensing element sensitive in the direction in the plane defined by the surface of the sensor die, and a wire on chip (WoC) associated with applying a magnetic field to the first test sensing element and the second test sensing element. The first test sensing element, the second test sensing element, and the WoC may be arranged such that, when current flows through the WoC, the first test sensing element senses a component of the magnetic field in the direction, and the second test sensing element senses a component of the magnetic field in a perpendicular direction.

公开(公告)号：US20190064246A1

公开(公告)日：2019-02-28

申请号：US16170893

申请日：2018-10-25

Applicant: Infineon Technologies AG

Inventor： Dirk HAMMERSCHMIDT ,  Manfred STEINER

IPC: G01R31/02

Abstract: Leakage current detection systems and detection methods are provided. A leakage current detection system includes a passive bridge circuit disposed on a circuit substrate, the passive bridge circuit including a first branch having a first output and a second branch having a second output; a leakage surge structure disposed on the circuit substrate, where the leakage surge structure is electrically connected to a common node at which the first branch and the second branch are connected and is configured to draw a leakage current thereto from the passive bridge circuit; and a processing device configured to monitor for the leakage current, including summing a first output value at the first output with a second output value at the second output to determine a summed value, performing a common mode test using the summed value, and outputting a monitored result based on the common mode test.

公开(公告)号：US20240019508A1

公开(公告)日：2024-01-18

申请号：US18366170

申请日：2023-08-07

Applicant: Infineon Technologies AG

Inventor： Christoph SCHROERS ,  Manfred STEINER ,  Armin WINKLER

IPC: G01R33/09 ,  G01R33/028 ,  G01R33/07

CPC classification number: G01R33/091 ,  G01R33/0283 ,  G01R33/07 ,  G01R33/0017

Abstract: A sensor die may include a set of sensing elements and a test structure associated with determining a magnetic sensitivity of the set of sensing elements. The test structure includes a first test sensing element sensitive in a direction in a plane defined by a surface of the sensor die, a second test sensing element sensitive in the direction in the plane defined by the surface of the sensor die, and a wire on chip (WoC) associated with applying a magnetic field to the first test sensing element and the second test sensing element. The first test sensing element, the second test sensing element, and the WoC may be arranged such that, when current flows through the WoC, the first test sensing element senses a component of the magnetic field in the direction, and the second test sensing element senses a component of the magnetic field in a perpendicular direction.

公开(公告)号：US20180188308A1

公开(公告)日：2018-07-05

申请号：US15393779

申请日：2016-12-29

Applicant: Infineon Technologies AG

Inventor： Dirk HAMMERSCHMIDT ,  Manfred STEINER

IPC: G01R31/02

CPC classification number: G01R31/025

Abstract: Leakage current detection systems and detection methods are provided. A leakage current detection system includes a passive bridge circuit including a first branch having a first output and a second branch having a second output, a first output pad electrically connected to the first output, a second output pad electrically connected to the second output, a leakage surge structure disposed between the first output pad and the second output pad, where the leakage surge structure is connected to a low-ohmic node and is configured to draw a leakage current from the passive bridge circuit and pull voltages at the first and the second output pads in a same direction on a condition that the leakage current flows through at least one element of the passive bridge circuit, and a processing device configured to monitor for the leakage current and output a monitored result.