-
公开(公告)号：US20240402204A1
公开(公告)日：2024-12-05
申请号：US18699606
申请日：2022-10-12
Applicant: Hitachi High-Tech Corporation
Inventor： Nobuya FUKUDA , Yukinori SAKASHITA , Kenta IMAI
IPC: G01N35/04
Abstract: An automatic analyzing system includes an automatic analyzer, a conveying portion for a vessel that accommodates a liquid, a loading portion that receives the vessel from the conveying portion and loads the vessel into the analyzer, and a correction portion that performs position correction between the conveying portion and the loading portion in order for the conveying portion to be able to deliver the vessel to the loading portion. The correction portion includes a hole provided in the loading portion and for constraining rotation motion, one rotation shaft or more, an extension and contraction portion that is provided in the loading portion and generates tension that holds a rotation angle constant, and a member that is provided in the conveying portion and constrains the rotation motion. By inserting the end of the member into the hole, the position correction between the conveying portion and the loading portion is performed.
-
公开(公告)号：US20230123687A1
公开(公告)日：2023-04-20
申请号：US17794543
申请日：2020-12-10
Applicant: Hitachi High-Tech Corporation
Inventor： Shigeru YANO , Kenta IMAI , Hideto TAMEZANE , Saori CHIDA
Abstract: The purpose of the present invention is to provide an automatic analysis system which, even when a large number of quality control samples is necessary, reduces the time necessary for quality control. To this end, this automatic analysis system is provided with multiple analysis devices (190), a conveyance unit (120) to which the analysis devices (190) are connected, and an operation unit (101) which operates the conveyance unit (120) to convey samples to the analysis device (190), wherein the automatic analysis system has a common storage cabinet (210) for storing the quality control samples that can be supplied to the multiple analysis devices (190), and in accordance with a rule registered in advance for each of the multiple analysis devices (190), the operation unit (101) operates the storage cabinet (210) to automatically convey a quality control sample to an analysis device (190).
-
公开(公告)号：US20240280598A1
公开(公告)日：2024-08-22
申请号：US18570130
申请日：2022-06-02
Applicant: Hitachi High-Tech Corporation , Roche Diagnostics Operations, Inc. , ROCHE DIAGNOSTICS GMBH , F. Hoffmann-La Roche AG
Inventor： Shunsuke SASAKI , Kenta IMAI , Maik Roger HADORN , Michael KUEHNL , Darius PUKAS , Mikolaj BRZEZINSKI , Janusz MARCHEWA
IPC: G01N35/00
CPC classification number: G01N35/00712 , G01N35/00693 , G01N2035/00653
Abstract: To improve diagnostic accuracy of a sensor of an automatic analyzer. A diagnostic system for diagnosing a sensor that is provided in an automatic analyzer and outputs an analog electrical signal includes a memory that stores data of the electrical signal output by the sensor and a replacement history of the sensor, and a processing device that processes data recorded in the memory, in which the processing device reads, from the memory, data for a set reference period from among electrical signal data output by a past sensor that was used in the automatic analyzer, calculates a statistical value of the data for a reference period, reads, from the memory, data recorded during a set evaluation period from among electrical signal data output by a sensor for diagnosis that is being used in the automatic analyzer, calculates a statistical value of the data for an evaluation period, and determines an abnormality of the sensor for diagnosis based on a difference obtained from the statistical value of the reference period and the statistical value of the evaluation period.
-
公开(公告)号：US20230067353A1
公开(公告)日：2023-03-02
申请号：US17792586
申请日：2020-12-09
Applicant: Hitachi High-Tech Corporation
Inventor： Yuki YOKOTA , Shunsuke SASAKI , Kenta IMAI , Takenori OKUSA
Abstract: The purpose of this invention is to provide an automated analyzer that is capable of photographing operations at a plurality of processing units while suppressing manufacturing cost growth. This automated analyzer comprises a plurality of processing units for carrying out operations related to analysis, a plurality of measurement instrument mounting parts that are disposed in each of the plurality of processing units and upon which a measuring instrument for measuring the operations of the plurality of processing units can be mounted, and a control unit for controlling the plurality of processing units. The plurality of measurement instrument mounting parts are configured such that the measuring instrument can be removed from each of the measurement instrument mounting parts and such that after being removed from one measurement instrument mounting part, the measuring instrument can be mounted on another measurement instrument mounting part.
-
公开(公告)号：US20240027485A1
公开(公告)日：2024-01-25
申请号：US18268390
申请日：2021-10-14
Applicant: HITACHI HIGH-TECH CORPORATION
Inventor： Nobuya FUKUDA , Kenta IMAI
IPC: G01N35/04
CPC classification number: G01N35/04 , G01N2035/0465 , G01N2035/0474
Abstract: There is provided an automatic analysis system that freely sets length or width dimensions to a traveling surface and that affects no influence on the layout of an automatic analyzer. In front of the automatic analyzer, a rail line is installed, and a transfer robot moves on the rail line. The rail line restrains roll, pitch, and yaw rotation directions, and thus the transfer robot does not fall. The rail line is fixed to a first jack and a second jack, each jack is in contact with the automatic analyzer and a body with no gap, and thus the roll, pitch, and yaw rotation directions of the rail line that is fixed to the jack are restrained. As a result, the length or width dimensions of a moving mechanism to the traveling surface are freely settable.
-
Patent Agency Ranking
公开(公告)号：US20230341426A1
公开(公告)日：2023-10-26
申请号：US17792215
申请日：2020-12-14
Inventor： Yusuke MIZUKI , Marina NAKAI , Shunsuke SASAKI , Kenta IMAI , Alexander SEILER , Gertraud EHRLICH-WEINREICH
CPC classification number: G01N35/00584 , G01N35/025 , G01N35/1002 , G01N2035/00891
Abstract: An automatic analyzer is capable of reducing the time required for a series of maintenance operations in that the user’s maintenance work is linked to the device driving so that the maintenance work proceeds in the order of the maintenance work tools. An automatic analyzer includes a plurality of processing units for processing a specimen: an agitation mechanism, a reagent dispensing mechanism, a mixer, an incubator, and a specimen dispensing mechanism. A control unit controls a processing unit, an analysis unit, and a display unit and causes the display unit to display a plurality of maintenance work tools used for maintenance work performed by the operator on the plurality of processing units and to display the maintenance work contents of the plurality of processing units that continuously use one of the plurality of maintenance work tools, selected by the operator via the display unit.
-
公开(公告)号：US20250155460A1
公开(公告)日：2025-05-15
申请号：US18834169
申请日：2022-12-14
Inventor： Shunsuke SASAKI , Kenta IMAI , Maik Roger HADORN , Michael KUEHNL , Darius PUKAS , Mikolaj BRZEZINSKI , Janusz MARCHEWA
IPC: G01N35/00
Abstract: Such a parts anomaly detection system is provided as being able to detect the anomaly of the parts of the liquid transport system of the automatic analyzer without delay.
The parts anomaly detection system to detect the anomaly of the parts of the liquid transport system (22) which absorbs and discharges liquid with respect to a sensor (21) for sample inspection of an automatic analyzer (1) comprises: storage devices (31, 41) to store data of electric signals outputted by the sensor and processing devices (32, 42) to process the data recorded in the storage devices, in which the processing devices detect the anomaly of the parts of the liquid transport system based on the electric signals.-
公开(公告)号：US20240377422A1
公开(公告)日：2024-11-14
申请号：US18688966
申请日：2022-08-03
Applicant: Hitachi High-Tech Corporation
Inventor： Hikaru TAKIZAWA , Kenta IMAI
IPC: G01N35/00 , G05D1/689 , G05D101/00 , G05D105/80 , G06T7/00
Abstract: This automated analysis support robot for carrying out an inspection of an analysis module that automatically analyzes a biological sample comprises a vehicle body, a camera mounted on the vehicle body, a communication device which communicates directly or indirectly with the analysis module, and a computer for controlling the vehicle body and the camera, wherein the computer: controls the vehicle body to move to a predetermined operating position and to face an inspection target provided in the analysis module; images the inspection target using the camera; and processes a video of the inspection target to calculate management data relating to the inspection target.
-
9.发明公开公开(公告)号：US20230375580A1
公开(公告)日：2023-11-23
申请号：US18025117
申请日：2021-02-17
Applicant: Hitachi High-Tech Corporation
Inventor： Aika NAKAJIMA , Masahiko IIJIMA , Kenta IMAI , Shunsuke SASAKI
IPC: G01N35/00
CPC classification number: G01N35/00623 , G01N2035/00643
Abstract: The present invention provides a system that makes a recommendation, to an operator, of a countermeasure method considered appropriate from a precursory stage of abnormality. This recommended action notification system comprises: a plurality of automatic analyzers 51 that include a first automatic analyzer; and a learning device 52 that is connected to a network 53. The recommended action notification system is for making a recommendation to an operator for an action to be executed on the first automatic analyzer. Said recommended action notification system is provided with: a processing portion 63 that receives specimen analysis result data or maintenance result data from the first automatic analyzer, that inputs related device data including the specimen analysis result data or the maintenance result data to learning models 72, and that, when a probability value that is for recommending execution of a predetermined action and that is outputted by a learning model is equal to or higher than a predetermined threshold value, makes a recommendation to the operator for the predetermined action to be executed on the first automatic analyzer; and an update portion 71 that updates the learning model on the basis of the learning dataset from the plurality of automatic analyzers.
-
公开(公告)号：US20230010798A1
公开(公告)日：2023-01-12
申请号：US17781851
申请日：2020-10-27
Applicant: HITACHI HIGH-TECH CORPORATION
Inventor： Yuichiro OTA , Kenta IMAI , Shunsuke SASAKI , Hidekazu TEZUKA , Hiroya UMEKI
Abstract: The invention has an object to provide an automatic analyzer and a control program that can shorten total analysis time. The automatic analyzer comprises: a sample rack that houses a sample; a sample dispensing mechanism that aspirates the sample from the sample rack and dispenses the sample into a reaction container; a plurality of detection units that detect a reaction liquid in the reaction container; and a control unit that controls the sample dispensing mechanism and the detection units. The control unit checks the measurement item specified for the sample and checks one of the detection units that is specified by the measurement item. When measurements specifying the same detection unit among the detection units are specified consecutively, the order of dispensing by the sample dispensing mechanism is changed so that measurements specifying different detection units are made consecutively.
-
-
-
-
-
-
-
-
-
Search Results
14
records
(took 0.016 seconds)
