Monochromator for charged particles
    1.
    发明授权
    Monochromator for charged particles 失效
    带电粒子的单色器

    公开(公告)号:US4412131A

    公开(公告)日:1983-10-25

    申请号:US249246

    申请日:1981-03-30

    CPC classification number: H01J49/26 H01J37/05

    Abstract: A monochromator for charged particles comprises a premonochromator and a main monochromator is tandem with a retarding lens disposed therebetween. The arrangement is suitable for electron energy loss spectrometry due to the high achievable intensities.

    Abstract translation: 用于带电粒子的单色器包括预分选机,并且主单色仪与设置在其间的延迟透镜串联。 由于高可实现的强度,该装置适用于电子能量损失光谱测定。

    Electronic or ionic optical apparatus
    2.
    发明授权
    Electronic or ionic optical apparatus 失效
    电子或离子光学仪器

    公开(公告)号:US4270053A

    公开(公告)日:1981-05-26

    申请号:US89840

    申请日:1979-10-31

    CPC classification number: H01J49/06

    Abstract: Electronic or ionic optical apparatus having baffled wall areas wherein the individual baffles are constructed and positioned such that a maximum probability is created for particles departing from the desired paths through the apparatus to pass through the baffles. A chamber is preferably provided behind the baffled wall areas which is closed off except for the openings between the individual baffles.

    Abstract translation: 电子或离子光学装置具有挡板壁区域,其中各个挡板被构造和定位,使得对于离开通过装置的期望路径的颗粒通过挡板产生最大概率。 除了各个挡板之间的开口之外,腔室优选设置在挡板壁区域后面被封闭。

    Beam guidance for electron beam tests, and electron impact spectrometer
having such beam guidance
    3.
    发明授权
    Beam guidance for electron beam tests, and electron impact spectrometer having such beam guidance 失效
    电子束测试的光束指导和具有这种光束引导的电子轰击光谱仪

    公开(公告)号:US4300045A

    公开(公告)日:1981-11-10

    申请号:US107592

    申请日:1979-12-27

    CPC classification number: H01J49/06 H01J49/48

    Abstract: A beam guidance for electron beam tests, especially of solid bodies. The ctrons cathodically emitted and electron-optically bundled are subjected at least to an energy selection in a cylinder condenser deflection unit and are subsequently detected or indicated in a detector. The emission and bundling systems are arranged in such a way that the electrons, in the plane at right angles to the cylinder condenser axis, are focused upon the inlet shield or baffle of the condenser, yet are focused at right angles thereto upon the detector. Also disclosed is an electron impact spectrometer having such a beam guidance, and an emission system encompassing a cathode and a lens system for focusing an electron current or flow upon an inlet baffle of a monochromator, with such flow entering into the cylinder condenser monochromator for energy selection of the electrons, which emanate bundled from the monochromator and strike or fall upon the probe or test sample and after reflection thereon come by way of a lens system into the cylinder condenser analyzer and after energy selection and passage through the outlet baffle of the analyzer strike or impinge upon a detector.

    Abstract translation: 用于电子束测试的光束引导,特别是固体的测试。 阴极发射的电子和电子束的电子至少在气缸冷凝器偏转单元中进行能量选择,随后在检测器中检测或指示。 发射和捆扎系统被布置成使得在与圆柱形冷凝器轴线成直角的平面中的电子被聚焦在冷凝器的入口屏蔽或挡板上,但是在检测器上与其成直角聚焦。 还公开了具有这种光束引导的电子轰击光谱仪,以及包括阴极和透镜系统的发射系统,用于将电子流或流动聚焦在单色仪的入口挡板上,这样的流进入气缸电容器单色器以获得能量 从单色仪发射并发射或落在探针或测试样品上并在其上反射之后的电子的选择通过透镜系统进入气瓶冷凝器分析器,并且在能量选择和通过分析器的出口挡板之后 撞击或撞击检测器。

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