Enclosure for ion trapping device

    公开(公告)号:US11410844B2

    公开(公告)日:2022-08-09

    申请号:US16950607

    申请日:2020-11-17

    Abstract: Devices, methods, and systems for enclosures for an ion trapping device are described herein. One enclosure for an ion trapping device includes a heat spreader base that includes a plurality of apertures. The ion trapping device may also include a grid array having a plurality of pins extending outward from a surface of the grid array. The apertures of the heat spreader base may be arranged such that the plurality of pins passes through the plurality of apertures.

    ENCLOSURE FOR ION TRAPPING DEVICE

    公开(公告)号:US20210082681A1

    公开(公告)日:2021-03-18

    申请号:US16950607

    申请日:2020-11-17

    Abstract: Devices, methods, and systems for enclosures for an ion trapping device are described herein. One enclosure for an ion trapping device includes a heat spreader base that includes a plurality of apertures. The ion trapping device may also include a grid array having a plurality of pins extending outward from a surface of the grid array. The apertures of the heat spreader base may be arranged such that the plurality of pins passes through the plurality of apertures.

    Enclosure for ion trapping device

    公开(公告)号:US11380535B2

    公开(公告)日:2022-07-05

    申请号:US16950607

    申请日:2020-11-17

    Abstract: Devices, methods, and systems for enclosures for an ion trapping device are described herein. One enclosure for an ion trapping device includes a heat spreader base that includes a plurality of apertures. The ion trapping device may also include a grid array having a plurality of pins extending outward from a surface of the grid array. The apertures of the heat spreader base may be arranged such that the plurality of pins passes through the plurality of apertures.

    Icing resistance total temperature probe with integrated ejector

    公开(公告)号:US10436649B2

    公开(公告)日:2019-10-08

    申请号:US15583799

    申请日:2017-05-01

    Abstract: Embodiments of icing resistant total temperature probes with integrated ejectors are provided. One air data probe comprises: a base; a body having a leading and trailing edges: a first passage defining a first annulus; a temperature sensor within the first passage; a heat shield defining an exterior wall of at least part of the first passage, wherein the sensor is positioned within the shield; a second passage comprising a second annulus defined by a space between the shield and the body; an intake port having an intake aperture that opens to the first and second passages; a separate heated airflow passage, the heated airflow passage having an air input port configured to couple to an air supply source and following a path within the probe body; an integrated air ejector coupled to heated airflow passage to motivate air into the intake aperture and through the first and second air passages.

    ICING RESISTANCE TOTAL TEMPERATURE PROBE WITH INTEGRATED EJECTOR

    公开(公告)号:US20180313698A1

    公开(公告)日:2018-11-01

    申请号:US15583799

    申请日:2017-05-01

    CPC classification number: G01K1/20 G01K13/02 G01K13/028 G01K2205/02

    Abstract: Embodiments of icing resistant total temperature probes with integrated ejectors are provided. One air data probe comprises: a base; a body having a leading and trailing edges: a first passage defining a first annulus; a temperature sensor within the first passage; a heat shield defining an exterior wall of at least part of the first passage, wherein the sensor is positioned within the shield; a second passage comprising a second annulus defined by a space between the shield and the body; an intake port having an intake aperture that opens to the first and second passages; a separate heated airflow passage, the heated airflow passage having an air input port configured to couple to an air supply source and following a path within the probe body; an integrated air ejector coupled to heated airflow passage to motivate air into the intake aperture and through the first and second air passages.

    SYSTEMS AND METHODS FOR ICING RESISTANT TOTAL AIR TEMPERATURE PROBES WITH AIR JETS

    公开(公告)号:US20180188118A1

    公开(公告)日:2018-07-05

    申请号:US15399611

    申请日:2017-01-05

    CPC classification number: G01K13/02 G01K1/00 G01K13/028 G01K2013/024

    Abstract: Systems and methods for icing resistant total air temperature probes with air jets are presented. In one embodiment, a probe comprises: a base having a forced air input port; and a body having leading and trailing edges extending from the base, the body comprising: a first interior airflow passage; a temperature sensor positioned within the first airflow passage; a notched intake port at a distal end of the body including an open channel extending into an intake aperture, and a cutaway region defining a recessed second face inset from the first face and exposes the open channel. The intake aperture opens into the first interior airflow passage, the notched intake port comprising air jet ports at a tip of the notched intake port; and a heated airflow passage through the body and isolated from the first interior airflow passage, coupling the forced air input port to the air jet ports.

    Cryogenic radio-frequency resonator for surface ion traps

    公开(公告)号:US10804871B1

    公开(公告)日:2020-10-13

    申请号:US16412278

    申请日:2019-05-14

    Abstract: The present subject matter provides technical solutions for the technical problems facing cryogenic ion traps by providing a cryogenic radio-frequency (RF) resonator that is compact, monolithic, modular, and impedance-matched to a cryogenic ion trap. The cryogenic RF resonator described herein is power-efficient, properly impedance-matched to the RF source, has a stable gain profile, and is compatible with a low temperature and ultra-high vacuum environment. In some examples, the gain profile is selected so that the cryogenic RF resonator acts as a cryogenic RF amplifier. This cryogenic RF resonator improves the performance of ion traps by reducing or minimizing the heat load and reducing or minimizing the unwanted noise that may erroneously drive trapped ions. These features of the present subject matter improve the performance of atomic clocks and mass spectrometers, and especially improve the performance of trapped ion quantum computers.

    Systems and methods for icing resistant total air temperature probes with air jets

    公开(公告)号:US10337931B2

    公开(公告)日:2019-07-02

    申请号:US15399611

    申请日:2017-01-05

    Abstract: Systems and methods for icing resistant total air temperature probes with air jets are presented. In one embodiment, a probe comprises: a base having a forced air input port; and a body having leading and trailing edges extending from the base, the body comprising: a first interior airflow passage; a temperature sensor positioned within the first airflow passage; a notched intake port at a distal end of the body including an open channel extending into an intake aperture, and a cutaway region defining a recessed second face inset from the first face and exposes the open channel. The intake aperture opens into the first interior airflow passage, the notched intake port comprising air jet ports at a tip of the notched intake port; and a heated airflow passage through the body and isolated from the first interior airflow passage, coupling the forced air input port to the air jet ports.

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