Particle therapy system
    1.
    发明授权
    Particle therapy system 有权
    粒子治疗系统

    公开(公告)号:US09492684B2

    公开(公告)日:2016-11-15

    申请号:US14763595

    申请日:2013-10-10

    申请人: HITACHI, LTD.

    IPC分类号: A61N5/10

    摘要: The present invention provides a particle therapy system including an irradiation compensating device made up of an energy absorber, a first collimator, and a second collimator for use in a short-range region. The irradiation compensating device is characterized by a mechanism for attaching and detaching the first energy absorber, first collimator, and second collimator. The first collimator is located upstream where the beam diameter is small with a view to suppressing the width of the compensating device, thereby contributing to making the compensating device small and lightweight. The second collimator is located downstream to improve penumbrae.

    摘要翻译: 本发明提供了一种粒子治疗系统,其包括由能量吸收器,第一准直仪和第二准直仪构成的照射补偿装置,用于短距离区域。 照射补偿装置的特征在于用于附接和分离第一能量吸收器,第一准直器和第二准直器的机构。 第一准直器位于光束直径小的上游,以抑制补偿装置的宽度,从而有助于使补偿装置小而轻。 第二个准直器位于下游,以改善半暗带。

    Particle therapy system
    2.
    发明授权

    公开(公告)号:US10143436B2

    公开(公告)日:2018-12-04

    申请号:US14655192

    申请日:2013-10-10

    申请人: HITACHI, LTD.

    IPC分类号: A61B6/00 A61N5/10

    摘要: The particle therapy system includes a particle beam generator for generating a particle beam; an irradiation nozzle arranged in a treatment room and irradiating a target with the particle beam; a particle beam transport system communicating the particle beam generator with the irradiation nozzle; an X-ray imaging device arranged in the treatment room and imaging the position of the target through irradiation with X-rays; a dosimeter arranged at a position passed by the particle beam in the irradiation nozzle; and a control apparatus performing control to exclude the measurement result of the X-rays from the measurement result obtained using the dosimeter when the X-rays are emitted during treatment.

    Charged particle beam irradiation system
    3.
    发明授权
    Charged particle beam irradiation system 有权
    带电粒子束照射系统

    公开(公告)号:US09415241B2

    公开(公告)日:2016-08-16

    申请号:US14625662

    申请日:2015-02-19

    申请人: Hitachi, Ltd.

    IPC分类号: G21K5/04 A61N5/10

    摘要: The charged particle beam irradiation system includes a charged particle beam generating unit, scanning electromagnets, a beam irradiation apparatus, beam radiation dose measuring instrument(s), and a beam position measuring instrument for obtaining one or both of the position and the width of the beam scanned by the scanning electromagnets. The beam position measuring instrument obtains one or both of the position and the width of the beam for each irradiation spot and determines whether the obtained result is within an allowable range and obtains one or both of the position and the width of the charged particle beam for each split during irradiation to the spot with the charged particle beam regarding a split of which a dose is managed by dividing a part of or all of irradiation spots into irradiation sections and determines whether the obtained result is within an allowable range.

    摘要翻译: 带电粒子束照射系统包括带电粒子束产生单元,扫描电磁体,束照射装置,束辐射剂量测量仪器和用于获得位置和宽度中的一个或两个的束位置测量仪器 光束由扫描电磁铁扫描。 光束位置测量仪器获得每个照射点的光束的位置和宽度中的一个或两个,并且确定所获得的结果是否在允许范围内,并获得带电粒子束的位置和宽度中的一个或两个, 在通过将照射点的一部分或全部分割成照射部分来对通过分配剂量进行分割的带电粒子束照射到点处,并且确定所获得的结果是否在允许范围内,从而分开。

    CHARGED PARTICLE BEAM IRRADIATION SYSTEM
    4.
    发明申请
    CHARGED PARTICLE BEAM IRRADIATION SYSTEM 有权
    充电颗粒光束辐射系统

    公开(公告)号:US20150273241A1

    公开(公告)日:2015-10-01

    申请号:US14625662

    申请日:2015-02-19

    申请人: Hitachi, Ltd.

    IPC分类号: A61N5/10

    摘要: The charged particle beam irradiation system includes a charged particle beam generating unit, scanning electromagnets, a beam irradiation apparatus, beam radiation dose measuring instrument(s), and a beam position measuring instrument for obtaining one or both of the position and the width of the beam scanned by the scanning electromagnets. The beam position measuring instrument obtains one or both of the position and the width of the beam for each irradiation spot and determines whether the obtained result is within an allowable range and obtains one or both of the position and the width of the charged particle beam for each split during irradiation to the spot with the charged particle beam regarding a split of which a dose is managed by dividing a part of or all of irradiation spots into irradiation sections and determines whether the obtained result is within an allowable range.

    摘要翻译: 带电粒子束照射系统包括带电粒子束产生单元,扫描电磁体,束照射装置,束辐射剂量测量仪器和用于获得位置和宽度中的一个或两个的束位置测量仪器 光束由扫描电磁铁扫描。 光束位置测量仪器获得每个照射点的光束的位置和宽度中的一个或两个,并且确定所获得的结果是否在允许范围内,并获得带电粒子束的位置和宽度中的一个或两个, 在通过将照射点的一部分或全部分割成照射部分来对通过分配剂量进行分割的带电粒子束照射到点处,并且确定所获得的结果是否在允许范围内,从而分开。

    Radiation measuring device, particle beam therapy device provided with radiation measuring device, and method for calculating dose profile of particle beam
    5.
    发明授权
    Radiation measuring device, particle beam therapy device provided with radiation measuring device, and method for calculating dose profile of particle beam 有权
    辐射测量装置,具有辐射测量装置的粒子束治疗装置,以及粒子束剂量分布计算方法

    公开(公告)号:US09132285B2

    公开(公告)日:2015-09-15

    申请号:US14497891

    申请日:2014-09-26

    申请人: HITACHI, LTD.

    CPC分类号: A61N5/1071 G01T1/02 G01T1/29

    摘要: A radiation measuring device having a plurality of sensors configured to generate charges in response to the radiation includes a signal processing device. The signal processing device uses an signal generated by a proton beam irradiation device upon changing of beam energy and causes accumulation values of charges output from the sensors to be separately stored in a main control device for each value of the energy. The main control device calculates depth dose profiles for values of the beam energy from the accumulation values stored in the main control device and representing the charges. The main control device calculates a range of the beam for each of the values of the beam energy from the depth dose profiles, corrects the depth dose profiles for the values of the beam energy using a correction coefficient that depends on the range and sums the corrected depth dose profiles.

    摘要翻译: 具有被配置为响应于辐射产生电荷的多个传感器的辐射测量装置包括信号处理装置。 信号处理装置在改变光束能量时使用由质子束照射装置产生的信号,并且使得从各个传感器输出的电荷的积累值分别存储在主控制装置中,用于每个能量值。 主控制装置根据存储在主控装置中的积累值计算束能量的深度剂量分布,并表示电荷。 主控制装置根据深度剂量分布计算波束能量的每个值的波束的范围,使用取决于范围的校正系数校正波束能量的深度剂量分布,并且将校正的 深度剂量分布。