公开(公告)号：US11160994B2

公开(公告)日：2021-11-02

申请号：US16747794

申请日：2020-01-21

申请人： Hitachi, Ltd.

发明人： Daisuke Ono ,  Yuki Ito

IPC分类号： A61N5/10

摘要： The present invention makes it possible to reliably verify irradiation with a particle beam in accordance with a selected irradiation technique. A particle beam therapy system includes a charged particle beam generator accelerating the particle beam, an irradiator irradiating a target with the particle beam accelerated by the charged particle beam generator, and a controller controlling the charged particle beam generator and the irradiator. The controller controls the charged particle beam generator and the irradiator so as to irradiate the target with the particle beam through switching between at least two different irradiation techniques, and furthermore, after switching between the two irradiation techniques, controls the charged particle beam generator and the irradiator to perform tentative irradiation with the charged particle beam in accordance with one of the irradiation techniques switched, to verify the particle beam.

公开(公告)号：US09415241B2

公开(公告)日：2016-08-16

申请号：US14625662

申请日：2015-02-19

申请人： Hitachi, Ltd.

发明人： Yuki Ito ,  Koji Matsuda ,  Ryosuke Shinagawa ,  Masahiro Tadokoro ,  Arao Nishimura

IPC分类号： G21K5/04 ,  A61N5/10

CPC分类号： A61N5/1077 ,  A61N5/103 ,  A61N5/1043 ,  A61N5/1067 ,  A61N5/1071 ,  A61N2005/1074 ,  A61N2005/1087

摘要： The charged particle beam irradiation system includes a charged particle beam generating unit, scanning electromagnets, a beam irradiation apparatus, beam radiation dose measuring instrument(s), and a beam position measuring instrument for obtaining one or both of the position and the width of the beam scanned by the scanning electromagnets. The beam position measuring instrument obtains one or both of the position and the width of the beam for each irradiation spot and determines whether the obtained result is within an allowable range and obtains one or both of the position and the width of the charged particle beam for each split during irradiation to the spot with the charged particle beam regarding a split of which a dose is managed by dividing a part of or all of irradiation spots into irradiation sections and determines whether the obtained result is within an allowable range.

摘要翻译： 带电粒子束照射系统包括带电粒子束产生单元，扫描电磁体，束照射装置，束辐射剂量测量仪器和用于获得位置和宽度中的一个或两个的束位置测量仪器 光束由扫描电磁铁扫描。 光束位置测量仪器获得每个照射点的光束的位置和宽度中的一个或两个，并且确定所获得的结果是否在允许范围内，并获得带电粒子束的位置和宽度中的一个或两个， 在通过将照射点的一部分或全部分割成照射部分来对通过分配剂量进行分割的带电粒子束照射到点处，并且确定所获得的结果是否在允许范围内，从而分开。

公开(公告)号：US20150273241A1

公开(公告)日：2015-10-01

申请号：US14625662

申请日：2015-02-19

申请人： Hitachi, Ltd.

发明人： Yuki Ito ,  Koji Matsuda ,  Ryosuke Shinagawa ,  Masahiro Tadokoro ,  Arao Nishimura

IPC分类号： A61N5/10

CPC分类号： A61N5/1077 ,  A61N5/103 ,  A61N5/1043 ,  A61N5/1067 ,  A61N5/1071 ,  A61N2005/1074 ,  A61N2005/1087

摘要： The charged particle beam irradiation system includes a charged particle beam generating unit, scanning electromagnets, a beam irradiation apparatus, beam radiation dose measuring instrument(s), and a beam position measuring instrument for obtaining one or both of the position and the width of the beam scanned by the scanning electromagnets. The beam position measuring instrument obtains one or both of the position and the width of the beam for each irradiation spot and determines whether the obtained result is within an allowable range and obtains one or both of the position and the width of the charged particle beam for each split during irradiation to the spot with the charged particle beam regarding a split of which a dose is managed by dividing a part of or all of irradiation spots into irradiation sections and determines whether the obtained result is within an allowable range.

摘要翻译： 带电粒子束照射系统包括带电粒子束产生单元，扫描电磁体，束照射装置，束辐射剂量测量仪器和用于获得位置和宽度中的一个或两个的束位置测量仪器 光束由扫描电磁铁扫描。 光束位置测量仪器获得每个照射点的光束的位置和宽度中的一个或两个，并且确定所获得的结果是否在允许范围内，并获得带电粒子束的位置和宽度中的一个或两个， 在通过将照射点的一部分或全部分割成照射部分来对通过分配剂量进行分割的带电粒子束照射到点处，并且确定所获得的结果是否在允许范围内，从而分开。