METHOD FOR MANUFACTURING BACK-THINNED SOLID-STATE IMAGING DEVICE

    公开(公告)号:US20230045038A1

    公开(公告)日:2023-02-09

    申请号:US17792799

    申请日:2021-01-19

    Abstract: A method for manufacturing a back-illuminated solid-state imaging device includes a first step of preparing a first conduction-type semiconductor layer having a front surface and a back surface, a second step of forming a first asperity region on the front surface of the semiconductor layer by selectively etching the front surface of the semiconductor layer, a third step of forming a second asperity region on the front surface of the semiconductor layer by smoothening asperities of the first asperity region, and a fourth step of forming an insulating layer along the second asperity region and forming a plurality of charge transfer electrodes on the insulating layer.

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