SYSTEM AND METHOD FOR DETERMINING X-RAY EXPOSURE PARAMETERS
    2.
    发明申请
    SYSTEM AND METHOD FOR DETERMINING X-RAY EXPOSURE PARAMETERS 有权
    用于确定X射线曝光参数的系统和方法

    公开(公告)号:US20150359498A1

    公开(公告)日:2015-12-17

    申请号:US14305410

    申请日:2014-06-16

    Abstract: In accordance with one aspect of the present system, an X-ray detector of an X-ray imaging system includes a communication module configured to receive a pre-shot image from a detection circuitry and receive one or more pre-shot parameters from a source controller of the X-ray imaging system. The X-ray detector further includes an analysis module configured to determine one or more image characteristics of the pre-shot image. The X-ray detector further includes a determination module configured to calculate one or more main-shot parameters based on the one or more pre-shot parameters and the one or more image characteristics. The determination module is further configured to send the one or more main-shot parameters to the source controller of the X-ray imaging system.

    Abstract translation: 根据本系统的一个方面,X射线成像系统的X射线检测器包括通信模块,该通信模块被配置为从检测电路接收预发射图像,并从源头接收一个或多个预注射参数 X射线成像系统的控制器。 X射线检测器还包括分析模块,该分析模块被配置为确定预拍摄图像的一个或多个图像特性。 X射线检测器还包括确定模块,其被配置为基于一个或多个预注射参数和一个或多个图像特征来计算一个或多个主要参数。 确定模块还被配置为将一个或多个主要参数发送到X射线成像系统的源控制器。

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