On-chip capacitor
    1.
    发明授权
    On-chip capacitor 失效
    片上电容

    公开(公告)号:US06541840B1

    公开(公告)日:2003-04-01

    申请号:US09480456

    申请日:2000-01-11

    IPC分类号: H01L2900

    CPC分类号: H01L29/92

    摘要: An on-chip capacitor is provided with a P-type silicon substrate, a bottom N-well region formed on said P-type silicon substrate, mutually adjacent first P-well and first N-well regions formed on said bottom N-well region, a first electrode formed on said first N-well region, and a second electrode formed on said first P-well region, a coupling surface is formed with said first N-well region and said first P-well region and a capacitance is formed between a power source voltage and a grounding voltage formed between said first P-well region and said bottom N-well region. Thus it is not necessary to maintain a device region, to form a capacitance, to form wiring or maintain a wiring region as in a conventional MOS capacitance while it is possible to obtain a required decoupling capacitance.

    摘要翻译: 片上电容器设置有P型硅衬底,形成在所述P型硅衬底上的底部N阱区域,彼此相邻的第一P阱和形成在所述底部N阱区域上的第一N阱区域 形成在所述第一N阱区上的第一电极和形成在所述第一P阱区上的第二电极,形成有所述第一N阱区和所述第一P阱区并且形成电容的耦合表面 在所述第一P阱区域和所述底部N阱区域之间形成的电源电压和接地电压之间。 因此,不需要象现有的MOS电容那样保持器件区域,形成电容以形成布线或维持布线区域,同时可以获得所需的去耦电容。