公开(公告)号：US20170095930A1

公开(公告)日：2017-04-06

申请号：US15281091

申请日：2016-09-30

Applicant: FANUC CORPORATION

Inventor： Fumikazu WARASHINA ,  Keisuke WATANABE ,  Kenshirou OONO

IPC: B25J9/16

CPC classification number: B25J9/1697 ,  B25J9/1664 ,  B25J9/1692 ,  G05B2219/37097 ,  G05B2219/37561 ,  G05B2219/39017 ,  G05B2219/39045 ,  G05B2219/40003

Abstract: A robot system which is inexpensive and can easily measure a position of a target point. The system stores feature quantities of an image of a target mark included in an image acquired as reference data when the target mark is placed at a known first target mark position at the robot coordinate system and stores the first target mark position with respect to an arm tip as the position of the tool center point. The system compares the feature quantities obtained from the image acquired when the target mark is arranged at a second target mark position and the feature quantities of the reference data to make the arm tip move and calculates the second target mark position at the robot coordinate system based on a second robot position corresponding to the position of the arm tip after movement and the position of the tool center point.

公开(公告)号：US20200311588A1

公开(公告)日：2020-10-01

申请号：US16831808

申请日：2020-03-27

Applicant: FANUC CORPORATION

Inventor： Mitsunori WATANABE ,  Keisuke WATANABE

IPC: G06N7/00 ,  G06F16/901 ,  G06N20/00

Abstract: An inspection apparatus includes a group data creation unit configured to create group data obtained by dividing a plurality of samples into a plurality of groups, a statistical state calculation unit configured to perform a statistical process for the samples divided into each of the groups to calculate data indicating a statistical state of a predetermined data item between the groups, and a user interface unit configured to display the statistical state in a display format enabling recognition of the statistical state between the groups on the basis of the data indicating the statistical state of the predetermined data item between the groups calculated by the statistical state calculation unit.

公开(公告)号：US20190156474A1

公开(公告)日：2019-05-23

申请号：US16175837

申请日：2018-10-31

Applicant: FANUC Corporation

Inventor： Keisuke WATANABE

IPC: G06T7/00

Abstract: An appearance inspection device creates a combination of a first image which is a normal product image and a second image which is a product image as a comparison object, on the basis of a reference data set and a learning data set, and a machine learning device learns classification of a product corresponding to the second image as normal or not normal for the combination. The machine learning device observes the combination of the first image and the second image as a state variable representing a current state of an environment, acquires a label given to the second image as label data, and performs learning by associating the state variable with the label data.

公开(公告)号：US20200082225A1

公开(公告)日：2020-03-12

申请号：US16566884

申请日：2019-09-11

Applicant: FANUC Corporation

Inventor： Keisuke WATANABE ,  Yasuhiro SHIBASAKI

IPC: G06K9/62 ,  G06N20/00

Abstract: Disclosed is an inspection device including: a machine learning device that performs machine learning on the basis of state data acquired from an inspection target and label data indicating an inspection result related to the inspection target to generate a learning model; a learning model evaluation index calculation unit that calculates a learning model evaluation index related to the learning model generated by the machine learning device as an evaluation index used to evaluate the learning model; an inspection index acquisition unit that acquires an inspection index used in an inspection; and an index value determination unit that determines whether the learning model generated by the machine learning device satisfies the inspection index on the basis of the learning model evaluation index and the inspection index and outputs a result of the determination.

公开(公告)号：US20150224649A1

公开(公告)日：2015-08-13

申请号：US14618326

申请日：2015-02-10

Applicant: FANUC Corporation

Inventor： Keisuke WATANABE

IPC: B25J9/16

CPC classification number: B25J9/1697 ,  B25J9/1607 ,  B25J9/1692 ,  G05B19/4083 ,  G05B2219/39397 ,  G05B2219/40003 ,  Y10S901/09

Abstract: The robot system includes: a robot for performing predetermined operations on an object placed at a first object position; a first robot position storage configured to store the position of an arm end arranged in a predetermined positional relationship relative to the first object position; a target arrival state data storage configured to store feature quantities of the object on the camera image; a robot movement amount calculator configured to calculate the amount of movement in order to make the feature quantities of the object placed at a second object position coincide with the feature quantities of the target arrival state data; and a correction data calculator configured to calculate correction data based on the difference between the second robot position when the arm end has been moved based on the amount of movement and the first robot position.

Abstract translation: 机器人系统包括：机器人，用于对放置在第一物体位置的物体执行预定的操作; 第一机器人位置存储器，被配置为存储相对于所述第一对象位置以预定位置关系布置的臂端的位置; 目标到达状态数据存储器，被配置为存储所述对象在所述摄像机图像上的特征量; 被配置为计算移动量以使放置在第二物体位置的物体的特征量与目标到达状态数据的特征量一致的机器人移动量计算器; 以及校正数据计算器，其被配置为基于当所述臂端已经移动时的所述第二机器人位置与所述第一机器人位置之间的差异来计算校正数据。

公开(公告)号：US20200082297A1

公开(公告)日：2020-03-12

申请号：US16566881

申请日：2019-09-11

Applicant: FANUC Corporation

Inventor： Keisuke WATANABE ,  Yasuhiro SHIBASAKI

IPC: G06N20/00 ,  G06N5/04

Abstract: An inspection apparatus of the present disclosure includes: a machine learning device that performs machine learning on a basis of state data acquired from an inspection target and label data indicating an inspection result related to the inspection target to generate a learning model; a learning model evaluation index calculation unit that calculates a learning model evaluation index related to the learning model generated by the machine learning device as an evaluation index to be used to evaluate the learning model; an inspection index acquisition unit that acquires an inspection index to be used in the inspection; and a learning model selection unit that displays the learning model evaluation index and the inspection index so as to be comparable with each other regarding the learning model generated by the machine learning device, receives selection of the learning model by an operator, and outputs a result of the selection.

公开(公告)号：US20180122064A1

公开(公告)日：2018-05-03

申请号：US15797410

申请日：2017-10-30

Applicant: FANUC CORPORATION

Inventor： Keisuke WATANABE

IPC: G06T7/00 ,  G06K9/62 ,  G06K9/46

CPC classification number: G06T7/0008 ,  G06K9/4604 ,  G06K9/6201 ,  G06K2209/19 ,  G06T2207/30164

Abstract: An inspection condition determination device comprises: an addition unit that adds data mimicking a flaw assumed to occur in an inspection target to a designated position of a three-dimensional model of the inspection target; a generation unit that generates an image without a flaw by replicating an optical condition for capturing an image of the inspection target on the three-dimensional model, and an image with the flaw by replicating the optical condition on the three-dimensional model to which the data mimicking the flaw is added; a determination unit that determines whether or not a difference between the image without a flaw and the image with the flaw at the designated position exceeds a threshold that allows detection of the flaw in the inspection target; and an extraction unit that extracts an optical condition available for detecting flaws of multiple designated patterns from multiple optical conditions.