公开(公告)号：US10045690B2

公开(公告)日：2018-08-14

申请号：US14897205

申请日：2014-06-09

Applicant: Essilor International

Inventor： Martha Hernandez Castanedas ,  Gildas Marin ,  Larry Thibos ,  Tao Liu

IPC: A61B3/10 ,  A61B3/00

Abstract: A method for determining wave-front aberration data of a to-be-tested optical system comprising the steps of: a) providing a wave-front sensing image of light received from the tested optical system; b) providing a model representative of the optical system with at least an optical parameter representative of said model; and c) optimizing a set of wave-front coefficient data and said at least optical parameter of said model according to a merit function calculating the merit function comprises the steps of generating a wave-front sensing modeled image of light received from said model by the at least optical parameter and the set of wave-front coefficient data, and calculating a criteria based on shape parameter data of the wave-front sensing image and shape parameter data of the wave-front sensing modeled image, so as to obtain wave-front aberration data of the tested optical system.