Electromagnetic wave detector using quantum wells and subtractive detectors
    1.
    发明授权
    Electromagnetic wave detector using quantum wells and subtractive detectors 失效
    用于减法检测器的自补偿装置

    公开(公告)号:US06534758B2

    公开(公告)日:2003-03-18

    申请号:US09900873

    申请日:2001-07-10

    IPC分类号: H01L2700

    CPC分类号: H01L27/14652

    摘要: The basic idea is as follows: operational simulations of subtractive focal planes, based on the French patent No. 2 756 666, have shown that the optimal subtraction rate should not be total in order to preserve the dynamic range of the system. In this case, the low-frequency fluctuations of the temperature of the focal plane of the bias voltages will be amplified and will give rise to a fluctuation of the mean gray level of the signal at output of the multiplexer. This variation can be corrected simply by: the making of several columns of subtractive pixels without diffraction grating, for which the integrated signal is directly the residual level of the thermal current; the integration of a comparator circuit at input of the electronic card to subtract the signal generated in the reference pixels from the signals integrated into the active pixels.

    摘要翻译: 基本思想如下:基于法国专利号756666的减法焦平面的操作模拟表明,为了保持系统的动态范围,最佳减法率不应该是完全的。 在这种情况下,偏置电压的焦平面的温度的低频波动将被放大,并且将引起多路复用器的输出处的信号的平均灰度级的波动。 这种变化可以简单地通过以下方式来进行修正:制作几列不具有衍射光栅的减色像素,其中积分信号直接是热电流的剩余电平;比较器电路在电子卡的输入处的积分,以减去 信号在参考像素中从集成到有源像素的信号中产生。

    Bi-functional optical detector including four optical detectors used to detect combination of two wavelengths
    2.
    发明授权
    Bi-functional optical detector including four optical detectors used to detect combination of two wavelengths 有权
    双功能光学检测器,包括用于检测两个波长的组合的四个光学检测器

    公开(公告)号:US06627868B2

    公开(公告)日:2003-09-30

    申请号:US09852211

    申请日:2001-05-10

    IPC分类号: H01L2714

    CPC分类号: B82Y20/00 H01L27/14649

    摘要: A bi-functional optical detector including a first active photoconduction detection element configured to detect light within first and second wavelength ranges, a first diffraction grating associated with the first detection element and configured to couple the light within the first wavelength range so that the first active photoconducting detection element detects the light in the first wavelength range, a second active photoconduction detection element configured to detect light within the first and second wavelength ranges, and a second diffraction grating associated with the second detection element and configured to couple the light within the second wavelength range so that the second active photoconduction detection element detects the light in the second wavelength range. Also included is a third active photoconduction detection element associated with the first detection element and configured to detect the light within the first and second wavelength ranges, a fourth active photoconduction detection element associated with the second detection element and configured to detect the light within the first and second wavelength ranges, and a common contact layer separating the first and second detection elements from the third and fourth detection elements.

    摘要翻译: 一种双功能光学检测器,包括被配置为检测第一和第二波长范围内的光的第一有源光电导检测元件,与第一检测元件相关联并被配置为将光耦合在第一波长范围内的第一衍射光栅, 光电导检测元件检测第一波长范围内的光,配置成检测第一和第二波长范围内的光的第二有源光电导检测元件,以及与第二检测元件相关联的第二衍射光栅, 使得第二有源光电导检测元件检测第二波长范围内的光。 还包括与第一检测元件相关联并被配置为检测第一和第二波长范围内的光的第三有源光电导检测元件,与第二检测元件相关联并被配置为检测第一和第二波长范围内的光的第四有源光电导检测元件, 和第二波长范围,以及将第一和第二检测元件与第三和第四检测元件分开的公共接触层。

    Polarimetric optical device with an insulating layer between detectors
    3.
    发明授权
    Polarimetric optical device with an insulating layer between detectors 失效
    偏振光学器件在检测器之间具有绝缘层

    公开(公告)号:US06797938B2

    公开(公告)日:2004-09-28

    申请号:US10275893

    申请日:2002-11-12

    IPC分类号: G02F101

    摘要: This optical polarimetric detector comprises: a first active detector element having a photoconductor (1) with which a first diffraction grating (3) is associated allowing incident light from a first specific polarization direction to be coupled in the first detector element and allowing the latter to detect the light having this first polarization direction; a second active detector element having a photoconductor (1′) with which a second diffraction grating (3′) is associated allowing incident light from a second polarization direction to be coupled in the second detector element and allowing the latter to detect the light having this second polarization direction. Furthermore, a detector (2) is provided making it possible to eliminate the background noise detected by previous detectors.

    摘要翻译: 该光学偏振检测器包括:具有光电导体(1)的第一有源检测器元件,第一衍射光栅(3)与第一衍射光栅(3)相关联,允许来自第一特定偏振方向的入射光耦合在第一检测器元件中, 检测具有该第一偏振方向的光;具有光电导体(1')的第二有源检测器元件,第二衍射光栅(3')与第二衍射光栅(3')相关联,允许来自第二偏振方向的入射光耦合在第二检测器元件中, 允许后者检测具有该第二偏振方向的光。此外,提供检测器(2),使得可以消除由先前检测器检测到的背景噪声。

    Multispectral imaging device based on multiple quantum wells
    4.
    发明申请
    Multispectral imaging device based on multiple quantum wells 有权
    基于多量子阱的多光谱成像装置

    公开(公告)号:US20100108861A1

    公开(公告)日:2010-05-06

    申请号:US12605188

    申请日:2009-10-23

    IPC分类号: H01L31/0352 H01L27/146

    摘要: The invention relates to a multispectral imaging device comprising a multiple-quantum-well structure operating on inter-sub-band transitions by absorbing radiation at a wavelength λ lying within a set of wavelengths to which said structure is sensitive, said structure comprising a matrix of individual detection pixels, characterized in that the matrix is organized in subsets (Eij) of four individual detection pixels, a first individual detection pixel (Pλ1) comprising a first diffraction grating (Rλ1) sensitive to a first subset of wavelengths, a second individual detection pixel (Pλ2) comprising a second diffraction grating (Rλ2) sensitive to a second subset of wavelengths, a third individual detection pixel (Pλ3) comprising a third diffraction grating (Rλ3) sensitive to a third subset of wavelengths and a fourth individual detection pixel (PΔλ) not comprising a wavelength-selective diffraction grating, the first, second and third subsets of wavelengths belonging to the set of wavelengths to which said structure is sensitive.

    摘要翻译: 本发明涉及一种多光谱成像装置,其包括通过吸收位于所述结构敏感的一组波长内的波长λ的辐射而在子带间跃迁上操作的多量子阱结构,所述结构包括: 单个检测像素,其特征在于,矩阵被组织在四个单独检测像素的子集(Eij)中,第一个体检测像素(Pλ1)包括对第一波长子集敏感的第一衍射光栅(Rλ1),第二个体检测 包括对第二波长子集敏感的第二衍射光栅(Rλ2)的像素(Pλ2),包括对第三子波长敏感的第三衍射光栅(Rλ3)的第三个别检测像素(Pλ3)和第四单独检测像素 P&Dgr;λ)不包括波长选择性衍射光栅,第一,第二和第三波长子集属于se 所述结构敏感的波长t。

    Bispectral electromagnetic wave detector
    5.
    发明授权
    Bispectral electromagnetic wave detector 失效
    双频电磁波探测器

    公开(公告)号:US6157020A

    公开(公告)日:2000-12-05

    申请号:US984950

    申请日:1997-12-04

    摘要: The disclosure relates to a bispectral electromagnetic wave detector including at least one first and one second overlaid plane active detector elements separated by a common layer, said first and second detector elements being sensitive to the different wavelengths; a first means of connection connected in common to said first and second detector elements, a second means of connection connected to said first detector element, and a third means of connection connected to said second detector element; means for applying successively a control voltage to each means of connection; and means connected to said first means of connection to detect a photoconduction current each time a control voltage is applied. The invention is used in applications requiring detection of electromagnetic waves in two bands of different wavelengths.

    摘要翻译: 本发明涉及一种双谱电磁波检测器,包括由公共层分离的至少一个第一和第二叠层有源检测器元件,所述第一和第二检测器元件对不同波长敏感; 连接到所述第一和第二检测器元件的第一连接装置,连接到所述第一检测器元件的第二连接装置和连接到所述第二检测器元件的第三连接装置; 用于连续地对每个连接装置施加控制电压的装置; 以及连接到所述第一连接装置的装置,以在每次施加控制电压时检测光电导电流。 本发明用于需要检测不同波长的两个波段中的电磁波的应用中。

    Multispectral imaging device based on multiple quantum wells
    6.
    发明授权
    Multispectral imaging device based on multiple quantum wells 有权
    基于多量子阱的多光谱成像装置

    公开(公告)号:US08378301B2

    公开(公告)日:2013-02-19

    申请号:US12605188

    申请日:2009-10-23

    IPC分类号: H01L29/06 H01L29/732

    摘要: The invention relates to a multispectral imaging device comprising a multiple-quantum-well structure operating on inter-sub-band transitions by absorbing radiation at a wavelength λ lying within a set of wavelengths to which said structure is sensitive, said structure comprising a matrix of individual detection pixels, characterized in that the matrix is organized in subsets (Eij) of four individual detection pixels, a first individual detection pixel (Pλ1) comprising a first diffraction grating (Rλ1) sensitive to a first subset of wavelengths, a second individual detection pixel (Pλ2) comprising a second diffraction grating (Rλ2) sensitive to a second subset of wavelengths, a third individual detection pixel (Pλ3) comprising a third diffraction grating (Rλ3) sensitive to a third subset of wavelengths and a fourth individual detection pixel (PΔλ) not comprising a wavelength-selective diffraction grating, the first, second and third subsets of wavelengths belonging to the set of wavelengths to which said structure is sensitive.

    摘要翻译: 本发明涉及一种多光谱成像装置,其包括通过吸收位于所述结构敏感的一组波长内的波长λ的辐射而在子带间跃迁上操作的多量子阱结构,所述结构包括: 单个检测像素,其特征在于,矩阵被组织在四个单独检测像素的子集(Eij)中,第一个体检测像素(Pλ1)包括对第一波长子集敏感的第一衍射光栅(Rλ1),第二个体检测 包括对第二波长子集敏感的第二衍射光栅(Rλ2)的像素(Pλ2),包括对第三子波长敏感的第三衍射光栅(Rλ3)的第三个别检测像素(Pλ3)和第四单独检测像素 P&Dgr;λ)不包括波长选择性衍射光栅,第一,第二和第三波长子集属于se 所述结构敏感的波长t。

    Electromagnetic wave detector with an optical coupling surface comprising lamellar patterns
    7.
    发明授权
    Electromagnetic wave detector with an optical coupling surface comprising lamellar patterns 失效
    具有包括层状图案的光耦合表面的电磁波检测器

    公开(公告)号:US07741594B2

    公开(公告)日:2010-06-22

    申请号:US10558187

    申请日:2004-05-26

    IPC分类号: H01L31/00

    摘要: The invention relates to a detector comprising a multiple quantum well structure operating on interband or intersubband transitions by absorption of radiation having a wavelength λ having a polarization comprising a component perpendicular to the plane of the multiple quantum well structure, and comprising optical coupling means for coupling said radiation, wherein the coupling means comprise a set of first diffractive lamellar features that are distributed along at least a first direction and a set of second diffractive lamellar features that are distributed along at least a second direction, said first and second directions being mutually perpendicular and lying in a plane parallel to the plane of the multiple quantum well structure.

    摘要翻译: 本发明涉及一种检测器,其包括通过吸收具有波长λ的波长的辐射而在带间或子带间跃迁上工作的多量子阱结构,该波长包括垂直于多量子阱结构的平面的分量的偏振,并且包括用于耦合的光耦合装置 所述辐射,其中所述耦合装置包括沿着至少第一方向分布的一组第一衍射层状特征和沿着至少第二方向分布的一组第二衍射层状特征,所述第一和第二方向是相互垂直的 并且位于平行于多量子阱结构的平面的平面中。

    Amorphous optical coupling structure for an electromagnetic wave detector and associated detector
    8.
    发明授权
    Amorphous optical coupling structure for an electromagnetic wave detector and associated detector 有权
    用于电磁波探测器和相关检测器的无定形光耦合结构

    公开(公告)号:US07687760B2

    公开(公告)日:2010-03-30

    申请号:US10558247

    申请日:2004-05-26

    IPC分类号: H01L31/00

    摘要: The invention relates to an optical coupling structure intended to couple electromagnetic radiation to the surface of a photodetector, wherein a coupling surface paved along mutually perpendicular first and second directions by a set of N series (M1i, M2i, . . . . Mni) of first features, second features, . . . nth features, the features being identical within any one series, the features being distributed along the first and second directions, the distance between the centers of two adjacent features or the inter-reticular distances between two adjacent features being variable. The subject of the invention is also a detector or a laser source comprising said coupling structure.

    摘要翻译: 本发明涉及一种用于将电磁辐射耦合到光电检测器的表面的光耦合结构,其中通过一系列N系列(M1i,M2i,...,Mni),沿着相互垂直的第一和第二方向铺设的耦合表面 第一个功能,第二个功能,。 。 。 第n个特征,特征在任何一个系列中是相同的,特征沿着第一和第二方向分布,两个相邻特征的中心之间的距离或两个相邻特征之间的网间距离是可变的。 本发明的主题还是包括所述耦合结构的检测器或激光源。

    Electromagnetic wave detector with an optical coupling surface comprising lamellar patterns
    9.
    发明申请
    Electromagnetic wave detector with an optical coupling surface comprising lamellar patterns 失效
    具有包括层状图案的光耦合表面的电磁波检测器

    公开(公告)号:US20060289728A1

    公开(公告)日:2006-12-28

    申请号:US10558187

    申请日:2004-05-26

    IPC分类号: H01J40/14

    摘要: The invention relates to a detector comprising a multiple quantum well structure operating on interband or intersubband transitions by absorption of radiation having a wavelength λ having a polarization comprising a component perpendicular to the plane of the multiple quantum well structure, and comprising optical coupling means for coupling said radiation, wherein the coupling means comprise a set of first diffractive lamellar features that are distributed along at least a first direction and a set of second diffractive lamellar features that are distributed along at least a second direction, said first and second directions being mutually perpendicular and lying in a plane parallel to the plane of the multiple quantum well structure.

    摘要翻译: 本发明涉及一种检测器,其包括通过吸收具有包括垂直于多量子阱结构的平面的分量的波长的波长λ的辐射而在带间或子带间跃迁上工作的多量子阱结构,并且包括用于耦合的光耦合装置 所述辐射,其中所述耦合装置包括沿着至少第一方向分布的一组第一衍射层状特征和沿着至少第二方向分布的一组第二衍射层状特征,所述第一和第二方向是相互垂直的 并且位于平行于多量子阱结构的平面的平面中。

    Polarimetric imaging device optimized for polarization contrast
    10.
    发明申请
    Polarimetric imaging device optimized for polarization contrast 审中-公开
    针对极化对比度优化的偏振成像装置

    公开(公告)号:US20100110433A1

    公开(公告)日:2010-05-06

    申请号:US12605194

    申请日:2009-10-23

    IPC分类号: G01J4/00

    摘要: The invention relates to a polarimetric imaging device comprising a multiple-quantum-well structure operating on inter-sub-band transitions by absorbing radiation at a wavelength λ, said structure comprising a matrix of individual detection pixels, characterized in that the matrix is organized in subsets of four individual pixels, a first pixel comprising a first diffraction grating (RP1) sensitive to a first polarization, a second polarimetric pixel comprising a second diffraction grating (RP2) sensitive to a second polarization orthogonal to the first polarization, a third polarimetric pixel comprising a third diffraction grating (RP3) sensitive to a third polarization oriented at an angle between the first and second polarizations and a fourth pixel not comprising a polarization-selective diffraction rating (R2D).

    摘要翻译: 本发明涉及一种偏振成像装置,其包括通过吸收波长为λ的辐射而在子带间转变上工作的多量子阱结构,所述结构包括单个检测像素的矩阵,其特征在于,所述矩阵被组织在 四个单独像素的子集,包括对第一偏振敏感的第一衍射光栅(RP1)的第一像素,包括对与第一偏振正交的第二偏振敏感的第二衍射光栅(RP2)的第二偏振像素,第三偏振像素 包括对以第一和第二偏振之间的角度取向的第三偏振敏感的第三衍射光栅(RP3)和不包括偏振选择性衍射等级(R2D)的第四像素。